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Chemical solution deposition of lanthanum zirconate barrier layers applied to low-cost coated-conductor fabrication

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Abstract

Epitaxial lanthanum zirconate (LZO) buffer layers have been grown by sol-gel processing on Ni–W substrates. We report on the application of these oxide films as seed and barrier layers in coated conductor fabrication as potentially simpler, lower cost coated-conductor architecture. The LZO films, about 80–100-nm thick, were found to have dense, crack-free surfaces with high surface crystallinity. Using 0.2-μm YBCO deposited by pulsed laser deposition, a critical current density of 2 MA/cm2 has been demonstrated on the LZO films (YBCO/LZO/Ni–W). Using 0.8-μm YBCO deposited using metal organic decomposition, a critical current density of 1.7 MA/cm2 and a critical current of 135 A/cm have been demonstrated on the LZO barrier layer with a sputtered CeO2 cap layer (YBCO/CeO2/LZO/Ni–W). These results offer promise to replace several of the vacuum-deposited layers in the typical coated conductor architecture (YBCO/CeO2/YSZ/Y2O3/Ni/Ni-W).

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Authors and Affiliations

  1. Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA

    S. Sathyamurthy, M. Paranthaman, H. Y. Zhai, S. Kang, T. Aytug, C. Cantoni, K. J. Leonard, E. A. Payzant, H. M. Christen & A. Goyal

  2. American Superconductors Inc., Westborough, Massachusetts, USA

    X. Li, U. Schoop, T. Kodenkandath & M. W. Rupich

Authors
  1. S. Sathyamurthy
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  2. M. Paranthaman
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  3. H. Y. Zhai
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  4. S. Kang
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  5. T. Aytug
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  6. C. Cantoni
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  7. K. J. Leonard
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  8. E. A. Payzant
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  9. H. M. Christen
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  10. A. Goyal
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  11. X. Li
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  12. U. Schoop
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  13. T. Kodenkandath
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  14. M. W. Rupich
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Sathyamurthy, S., Paranthaman, M., Zhai, H.Y. et al. Chemical solution deposition of lanthanum zirconate barrier layers applied to low-cost coated-conductor fabrication. Journal of Materials Research 19, 2117–2123 (2004). https://doi.org/10.1557/JMR.2004.0281

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  • DOI: https://doi.org/10.1557/JMR.2004.0281

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