Abstract
A single layer of La2Zr2O7 (LZO), deposited on textured Ni and Ni–1.7% Fe–3% W (Ni–W) tapes by a low-cost sol-gel process, is used as buffer layer for the growth of YBa2Cu3O7−δ (YBCO) coated conductors. It is shown for the first time that such single buffer layers can be used for the deposition of YBCO yielding critical current densities (Jc) that are comparable to those typically obtained using CeO2/YSZ/Y2O2 trilayers on identical substrates, i.e., in excess of 1 MA/cm2 at 77 K and self-field. The properties of the YBCO films and the dependence of Jc on thickness of the LZO layer are investigated.
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Sathyamurthy, S., Paranthaman, M., Zhai, HY. et al. Lanthanum zirconate: A single buffer layer processed by solution deposition for coated conductor fabrication. Journal of Materials Research 17, 2181–2184 (2002). https://doi.org/10.1557/JMR.2002.0319
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DOI: https://doi.org/10.1557/JMR.2002.0319