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Microstructural investigation of BaTiO3 thin films deposited on (001) MgO

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Abstract

The microstructure of BaTiO3 thin films, epitaxially deposited on (001) MgO by pulsed laser ablation, has been investigated by transmission electron microscopy. The films are always c-axis-orientated, but dislocations, {111} stacking faults, and antiphase boundaries are frequently observed. Conventional TEM and high-resolution microscopy allow one to deduce the Burgers vectors of dislocations as b1 = 〈100〉 or b2 = 〈110〉, both being perfect dislocations. Most extrinsic stacking faults are ending at 1/3〈112〉 or 1/3〈111〉 partial dislocations; the displacement vector of the antiphase boundaries is 1/2〈101〉. Studying the interfacial structure by means of zone images taken along [100] and [110] shows that the misfit is mainly released by dislocations with Burgers vectors of 1/2〈110〉 and 1/2〈101〉.

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Authors and Affiliations

  1. EMAT-RUCA, University Antwerp, Groenenborgerlaan 171, Antwerp, B-2020, Belgium

    C. H. Lei & G. Van Tendeloo

  2. Institut für Schicht und Ionontechnik, Jülich Research Centre, Jülich, D-52425, Germany

    M. Siegert & J. Schubert

Authors
  1. C. H. Lei
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  2. G. Van Tendeloo
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  3. M. Siegert
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  4. J. Schubert
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Correspondence to C. H. Lei.

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Lei, C.H., Van Tendeloo, G., Siegert, M. et al. Microstructural investigation of BaTiO3 thin films deposited on (001) MgO. Journal of Materials Research 17, 1923–1931 (2002). https://doi.org/10.1557/JMR.2002.0285

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