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Tb L3-edge X-ray Absorption Near-edge Structure Spectroscopic Analysis of Terbium-doped Phosphor Compoundsfor Plasma Display Panel Applications

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Abstract

We have analyzed Tb L3-edge x-ray absorption near-edge structure spectra of Tb-doped phosphor compounds for plasma display panel applications. Intensity and lifetime of the green emission from the Tb3+:5D47F5 transition were measured with respect to nominal terbium concentration in the host compounds, i.e., YBO3, YPO4,and Y4Al2O9, all of which were made through the solid-state reaction. Typical concentration quenching was evident on the fluorescence intensity and the fluorescing level lifetime in our samples. From the analyses of white line absorption peaks at TbL3-edge, it was verified that terbium is essentially trivalent in all the samples, even invery highly concentrated ones. Thus, this implies that the concentration quenching was not caused by presence of mixed-valent states of terbium. Instead, it is believed that anonradiative energy transfer route among Tb3+ ions might be responsible for thebehavior.

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References

  • M.S. Scholl and J.R. Trimmier, J. Electrochem. Soc. 133, 643 (1986).

    Article  CAS  Google Scholar 

  • N. Bodenschatz, R. Wannemacher, J. Heber, and D. Mateika, J. Lumin . 47, 159 (1991).

    Article  CAS  Google Scholar 

  • K.S. Sohn, Y.Y. Choi, H.D. Park, and Y.G. Choi, J. Electrochem. Soc. 147, 2375 (2000).

  • K.S. Sohn, Y.G. Choi, Y.Y. Choi, and H.D. Park, J. Electrochem. Soc. 147, 3552 (2000).

    Article  CAS  Google Scholar 

  • T. Hoshina, Jpn. J. Appl. Phys. 6, 1203 (1967).

    Article  CAS  Google Scholar 

  • R.G. DeLosh, T.Y. Tien, F.F. Gibbon, P.J. Zacmanidis, and H.L. Stadler, J. Chem. Phys. 53, 681 (1970).

    Article  CAS  Google Scholar 

  • W.F. van der Weg, T.J.A. Popma, and A.T. Vink, J. Appl. Phys. 57, 5450 (1985).

    Article  CAS  Google Scholar 

  • J.P. van der Ziel, L. Kopf, and L.G. van Uitert, Phys. Rev. B 6, 615 (1972).

    Article  Google Scholar 

  • Y.G. Choi, K.H. Kim, V.A. Chernov, and J. Heo, J. Non-Cryst. Solids 246, 128 (1999).

    Article  Google Scholar 

  • T.G. Choi, K.H. Kim, Y.S. Han, and J. Heo, Chem. Phys. Lett. 329, 370 (2000).

    Article  CAS  Google Scholar 

  • K.R. Pedersen and J.E. Jorgensen, Physica C 264, 185 (1996).

    Article  CAS  Google Scholar 

  • Z. Hu, G. Kaindl, and G. Meyer, J. Alloys Compd. 246, 186 (1997).

    Article  CAS  Google Scholar 

  • W. Wang, Y. Chen, and T. Hu, Appl. Phys. A 62, 163 (1996).

    Article  CAS  Google Scholar 

  • U. Staub, M.R. Antonio, L. Soderholm, M. Guillaume, W. Henggeler, and A. Furrer, Phy. Rev. B 50, 7085 (1997).

    Article  Google Scholar 

  • L. Soderholm, S. Skanthakurnar, U. Staub, M.R. Antonio, and C.W. Williams, J. Alloys Compd. 250, 623 (1997).

    Article  Google Scholar 

  • K.J. Rao and J. Wong, Solid State Chem. 55, 110 (1984).

    Article  CAS  Google Scholar 

  • J. Rohler, in Handbook on the Physics and Chemistry of Rare Earths, edited by K.A. Gschneidner Jr., L. Eyring, and S. Hufner (North-Holland, Amsterdam, The Netherlands, 1987), Vol. 10, p. 453.

    Article  CAS  Google Scholar 

  • S.A. Campbell, The Science and Engineering of Microelectronic Fabrication (Oxford University Press, New York, 1996).

    Google Scholar 

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Correspondence to Kee-Sun Sohn.

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Choi, Y.G., Sohn, KS., Kim, K.H. et al. Tb L3-edge X-ray Absorption Near-edge Structure Spectroscopic Analysis of Terbium-doped Phosphor Compoundsfor Plasma Display Panel Applications. Journal of Materials Research 17, 31–35 (2002). https://doi.org/10.1557/JMR.2002.0007

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  • DOI: https://doi.org/10.1557/JMR.2002.0007

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