Abstract
We have analyzed Tb L3-edge x-ray absorption near-edge structure spectra of Tb-doped phosphor compounds for plasma display panel applications. Intensity and lifetime of the green emission from the Tb3+:5D4→7F5 transition were measured with respect to nominal terbium concentration in the host compounds, i.e., YBO3, YPO4,and Y4Al2O9, all of which were made through the solid-state reaction. Typical concentration quenching was evident on the fluorescence intensity and the fluorescing level lifetime in our samples. From the analyses of white line absorption peaks at TbL3-edge, it was verified that terbium is essentially trivalent in all the samples, even invery highly concentrated ones. Thus, this implies that the concentration quenching was not caused by presence of mixed-valent states of terbium. Instead, it is believed that anonradiative energy transfer route among Tb3+ ions might be responsible for thebehavior.
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References
M.S. Scholl and J.R. Trimmier, J. Electrochem. Soc. 133, 643 (1986).
N. Bodenschatz, R. Wannemacher, J. Heber, and D. Mateika, J. Lumin . 47, 159 (1991).
K.S. Sohn, Y.Y. Choi, H.D. Park, and Y.G. Choi, J. Electrochem. Soc. 147, 2375 (2000).
K.S. Sohn, Y.G. Choi, Y.Y. Choi, and H.D. Park, J. Electrochem. Soc. 147, 3552 (2000).
T. Hoshina, Jpn. J. Appl. Phys. 6, 1203 (1967).
R.G. DeLosh, T.Y. Tien, F.F. Gibbon, P.J. Zacmanidis, and H.L. Stadler, J. Chem. Phys. 53, 681 (1970).
W.F. van der Weg, T.J.A. Popma, and A.T. Vink, J. Appl. Phys. 57, 5450 (1985).
J.P. van der Ziel, L. Kopf, and L.G. van Uitert, Phys. Rev. B 6, 615 (1972).
Y.G. Choi, K.H. Kim, V.A. Chernov, and J. Heo, J. Non-Cryst. Solids 246, 128 (1999).
T.G. Choi, K.H. Kim, Y.S. Han, and J. Heo, Chem. Phys. Lett. 329, 370 (2000).
K.R. Pedersen and J.E. Jorgensen, Physica C 264, 185 (1996).
Z. Hu, G. Kaindl, and G. Meyer, J. Alloys Compd. 246, 186 (1997).
W. Wang, Y. Chen, and T. Hu, Appl. Phys. A 62, 163 (1996).
U. Staub, M.R. Antonio, L. Soderholm, M. Guillaume, W. Henggeler, and A. Furrer, Phy. Rev. B 50, 7085 (1997).
L. Soderholm, S. Skanthakurnar, U. Staub, M.R. Antonio, and C.W. Williams, J. Alloys Compd. 250, 623 (1997).
K.J. Rao and J. Wong, Solid State Chem. 55, 110 (1984).
J. Rohler, in Handbook on the Physics and Chemistry of Rare Earths, edited by K.A. Gschneidner Jr., L. Eyring, and S. Hufner (North-Holland, Amsterdam, The Netherlands, 1987), Vol. 10, p. 453.
S.A. Campbell, The Science and Engineering of Microelectronic Fabrication (Oxford University Press, New York, 1996).
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Choi, Y.G., Sohn, KS., Kim, K.H. et al. Tb L3-edge X-ray Absorption Near-edge Structure Spectroscopic Analysis of Terbium-doped Phosphor Compoundsfor Plasma Display Panel Applications. Journal of Materials Research 17, 31–35 (2002). https://doi.org/10.1557/JMR.2002.0007
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DOI: https://doi.org/10.1557/JMR.2002.0007