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Synthesis of Zn1–xMgxO and its structural characterization

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Abstract

Zn1–xMgxO is an important material for optoelectronic devices. We synthesized this material using a solution-based route. We investigated in detail the structural behavior of this material system using x-ray diffraction and Raman spectroscopy. Mg substitution up to x ≈ 0.10 does not change the crystal structure, as revealed by x-ray diffraction and Raman spectroscopic studies. This synthesis route is also suitable to prepare thin films by spin coating with the possibility of p and n doping.

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Authors and Affiliations

  1. Physics Department, University of Puerto Rico, 00681, Mayaguez, Puerto Rico

    M. S. Tomar & R. Melgarejo

  2. Physics Department, University of Puerto Rico, 00931, San Juan, Puerto Rico

    P. S. Dobal & R. S. Katiyar

Authors
  1. M. S. Tomar
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  2. R. Melgarejo
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  3. P. S. Dobal
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  4. R. S. Katiyar
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Tomar, M.S., Melgarejo, R., Dobal, P.S. et al. Synthesis of Zn1–xMgxO and its structural characterization. Journal of Materials Research 16, 903–906 (2001). https://doi.org/10.1557/JMR.2001.0127

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  • DOI: https://doi.org/10.1557/JMR.2001.0127

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