Abstract
Well-aligned carbon nitride nanotubes were prepared with a porous alumina membrane as a template when using electron cyclotron resonance (ECR) plasma in a mixture of C2H2 and N2 as the precursor with an applied negative bias to the graphite sample holder. The hollow structure and good alignment of the nanotubes were verified by field-emission scanning electron microscopy. Carbon nitride nanotubes were transparent when viewed by transmission electron microscopy, which showed that the nanotubes were hollow with a diameter of about 250 nm and a length of about 50–80 μm. The amorphous nature of the nanotubes was confirmed by the absence of crystalline phases arising from selected-area diffraction patterns. Both Auger electron microscopy and x-ray photoelectron spectroscopy spectra indicated that these nanotubes are composed of nitrogen and carbon. The total N/C ratio is 0.72, which is considerably higher than other forms of carbon nitrides. No free-carbon phase was observed in the amorphous carbon nitride nanotubes. The absorption bands between 1250 and 1750 cm−1 in Fourier transform infrared spectroscopy provided direct evidence for nitrogen atoms, effectively incorporated within the amorphous carbon network. Such growth of well-aligned carbon nitride nanotubes can be controlled by tuning the ECR plasma conditions and the applied negative voltage to the alumina template.
Similar content being viewed by others
References
I. Brodie and C.A. Spindt, Adv. Electron. Electron Phys. 83, 1 (1992).
I. Brodies and P.R. Schwoebel, Proc. IEEE 82, 1006 (1994).
J.E. Jaskie, MRS Bull. 21(3), 59 (1996).
M.W. Geis, J.A. Gregory, and B.B. Pate, IEEE Trans. Electron Devices 38, 619 (1991).
M.W. Geis, J.C. Twichell, J. Macaulay, and K. Okano, Appl. Phys. Lett. 67, 1328 (1995).
N.S. Xu, R.V. Latham, and Y. Tzeng, Electron. Lett. 29, 1596 (1993).
K. Okano, S. Koizumi, S.R.P. Silva, and G.A.J. Amaratunga, Nature 381, 140 (1996).
M.W. Geis, J.C. Twichell, N.N. Efromow, K. Krohn, and T.M. Lyszczarz, Appl. Phys. Lett. 68, 2294 (1996).
I.H. Shin and T.D. Lee, J. Vac. Sci. Technol. B 17, 690 (1999).
G.A.J. Amaratunga and S.R.P. Silva, Appl. Phys. Lett. 68, 2529 (1996).
F.J. Himpsel, J.A. Knapp, J.A. Van Vechten, and D.E. Eastman, Phys. Rev. B 20, 624 (1979).
B.B. Pate, Surf. Sci. 165, 83 (1986).
G.A.J. Amaratunga and S.R.P. Silva, J. Non-Cryst. Solids 198–200, 611 (1996).
E.I. Givargizov, V.V. Zhirnov, A.V. Kuznestov, and P.S. Plekhanov, J. Vac. Sci. Technol. B 74, 2030 (1996).
S. Iijima, Nature 354, 56 (1991).
A.G. Rinzler, J.H. Hafner, P. Nikolaev, L. Lou, S.G. Kim, D. Tománek, P. Nordlander, D.T. Colbert, and R.E. Smalley, Science 268, 1550 (1995).
W.A. de Heer, A. Châtelain, and D. Ugarte, Science 270, 1179 (1995).
W.A. de Heer, J-M. Bonard, K. Fauth, A. Châtelain, L. Forró, and D. Ugarte, Adv. Mater. 9, 87 (1997).
Yu.V. Gulyaev, L.A. Chemozatonskii, Z.Ja. Kosakovskaja, N.I. Sinitsyn, G.V. Torgashov, and Yu.F. Zakharchenko, J. Vac. Sci. Technol. B 13, 435 (1995).
T.G. Tsai, Ph.D. Thesis of NTHU (1997).
S.H. Tsai, C.W. Chao, C.L. Lee, X.W. Liu, I.N. Lin, and H.C. Shih, Electrochem. Solid-State Lett. 2, 247 (1999).
S.L. Sung, S.H. Tsai, C.H. Tseng, F.K. Chiang, X.W. Liu, and H.C. Shih, Appl. Phys. Lett. 74, 197 (1999).
K. Suenaga, M.P. Johansson, N. Hellgren, E. Broitman, L.R. Wallenberg, C. Colliex, J-E. Sundgren, and L. Hultman, Chem. Phys. Lett. 300, 695 (1999).
M. Terrones, P. Redlich, N. Grobert, S. Trasobares, W-K. Hsu, H. Terrones, Y-Q. Zhu, J.P. Hare, C.L. Reeves, A.K. Cheetham, M. Rühle, H.W. Kroto, and D.R.M. Walton, Adv. Mater. 11, 655 (1999).
S.R.P. Silva, G.A.J. Amaratunga, and J.R. Barnes, Appl. Phys. Lett. 71, 1477 (1997).
T.W. Ebbesen and P.M. Ajayan, Nature 358, 220 (1992).
C. Journet, W.K. Maser, P. Bernier, A. Loiseau, M.L. Chapelle, S. Lefrant, P. Deniard, R. Lee, and J.E. Fischer, Nature 388, 756 (1997).
M. Endo and H.W. Kroto, J. Phys. Chem. 96, 6941 (1992).
W.K. Hsu, M. Terrones, J.P. Hare, H. Terrones, H.W. Kroto, and D.R.M. Walton, Chem. Phys. Lett. 262, 161 (1996).
W.A. de Heer, W.S. Bacsa, A. Châtelain, T. Gerfin, R. Humphrey-Baker, L. Forro, and D. Ugarte, Science 268, 845 (1995).
W.Z. Li, S.S. Xie, L.X. Qian, B.H. Chang, B.S. Zou, W.Y. Zhou, R.A. Zhao, and G. Wang, Science 274, 1701 (1996).
M. Terrones, N. Grobert, J. Olivares, J.P. Zhang, H. Terrones, K. Kordatos, W.K. Hsu, J.P. Hare, P.D. Townsend, K. Prassides, A.K. Cheetham, H.W. Kroto, and D.R.M. Walton, Nature 388, 52 (1997).
M. Kusunoki, M. Rokkaku, and T. Suzuki, Appl. Phys. Lett. 71, 2620 (1997).
Z.F. Ren, Z.P. Huang, J.W. Xu, J.H. Wang, P. Bush, M.P. Siegal, and P.N. Provencio, Science 282, 1105 (1998).
S.S. Fan, M.G. Chapline, N.R. Franklin, T.W. Tombler, A.M. Cassell, and H.J. Dai, Science 283, 512 (1999).
S.H. Tsai, C.W. Chao, C.L. Lee, and H.C. Shih, Appl. Phys. Lett. 74, 3462 (1999).
A. Heilmann, P. Jutzi, A. Klipp, U. Kreibig, R. Neuendorf, T. Sawitowski, and G. Schmid, Adv. Mater. 10, 398 (1998).
T.G. Tsai, K.J. Chao, X.J. Guo, S.L. Sung, C.N. Wu, Y.L. Wang, and H.C. Shih, Adv. Mater. 9, 1154 (1997).
O. Jessensky, F. Müller, and U. Gele, Appl. Phys. Lett. 72, 1173 (1998).
C.D. Wagner, L.E. Davis, L.H. Gale, R.H. Raymond, J.A. Taylor, and M.V. Zeller, Surf. Interface Anal. 3, 211 (1981).
J. Casanovas, J.M. Ricart, J. Rubio, F. Illas, and J.M. Jiménez-Mateos, J. Am. Chem. Soc. 118, 8071 (1996).
M. Kawaguchi, Adv. Mater. 9, 615 (1997).
D. Marton, K.J. Boyd, A.H. Al-Bayati, S.S. Todorov, and J.W. Rabalais, Phys. Rev. Lett. 73, 118 (1994).
M. Barber, J.A. Connor, M.F. Guest, I.H. Hillier, M. Schwarz, and M. Stacey, J. Chem. Soc. Faraday Trans. 2 69, 551 (1973).
U. Gelius, R.F. Heden, J. Hedman, B.J. Lindberg, R. Manne, R. Nordberg, R. Nordling, and K. Siegbahn, Phys. Scr. 2, 70 (1970).
J.H. Kaufman, S. Metin, and D.D. Saperstein, Phys. Rev. B 39, 13053 (1989).
D.L. Vien, N.B. Colthup, W.G. Fateley, and J.G. Grasselli, The Handbook of Infrared and Raman Characteristic Frequencies of Organic Molecules (Academic Press, San Diego, CA, 1991).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Sung, S.L., Tsai, S.H., Liu, X.W. et al. A novel form of carbon nitrides: Well-aligned carbon nitride nanotubes and their characterization. Journal of Materials Research 15, 502–510 (2000). https://doi.org/10.1557/JMR.2000.0075
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/JMR.2000.0075