Abstract
The phase formation sequence in Nb/Si multilayers formed at different deposition temperatures was investigated by x-ray diffraction (XRD) and transmission electron microscopy (TEM). The amorphous phases were found to form in Nb/Si multilayers deposited at room temperature and 560 °C, but the compositions of these two amorphous phases were different. The crystalline Nb3Si and Nb5Si3 were formed in Nb/Si multilayers deposited at 180–500 °C. The interfacial energy and modified heat of formation are adopted to explain our obtained results. The occurrence of crystalline Nb5Si3, NbSi2, and amorphous silicide phase was found when the Nb/Si multilayers with Nb3Si phase were annealed at 550 °C, while only NbSi2 was found to form when annealing this sample at 700 °C. The mobility of Si takes an important role in phase formation in Nb/Si multilayers.
Similar content being viewed by others
References
M. Ronay, Appl. Phys. Lett. 42, 577 (1983).
J. R. Abelson, K. B. Kim, D. E. Mercer, C. R. Helms, R. Sinclair, and W. Sigmon, J. Appl. Phys. 63, 689 (1988).
W. Lur and L. J. Chen, Appl. Phys. Lett. 54, 1217 (1989).
T. L. Lee and L. J. Chen, J. Appl. Phys. 73, 8258 (1993).
W. H. Wang and W. K. Wang, J. Appl. Phys. 76 (3), 1578 (1994).
R. Bene, J. Appl. Phys. 61 (5), 1826 (1987).
F. M. d’Heurle and P. Gas, J. Mater. Res. 1, 205 (1986).
U. Gosele and K. N. Tu, J. Appl. Phys. 66, 2612 (1989).
S. F. Gong and H. T. Hentzell, J. Appl. Phys. 68 (9), 4542 (1990).
E. E. Fullerton, J. Pearson, C. H. Sowers, and S. D. Bader, Phys. Rev. B 48, 17 432 (1993).
J-M. Baribeau, D. J. Lockwood, and R. W. G. Syme, J. Appl. Phys. 83 (3), 1450 (1996).
S. S. Parkin and B. R. York, Appl. Phys. Lett. 62 (15), 1842 (1993).
W. H. Wang and W. K. Wang, J. Mater. Res. 9, 401 (1994).
W. H. Wang and W. K. Wang, J. Appl. Phys. 76 (3), 1578 (1994).
T. L. Lee and L. J. Chen, J. Appl. Phys. 75 (4), 2007 (1994).
J. Y. Cheng and L. J. Chen, J. Appl. Phys. 69 (4), 2161 (1991).
K. N. Tu and J. W. Mayer, in Thin Films, Interdiffusion and Reactions, edited by J. M. Poate, K.N. Tu, and J.W. Mayer (Wiley, New York, 1978).
M. A. Nicolet and S. S. Lau, in VLSI Electronic, Microstructure Science, edited by N. G. Einapruch and G. B. Larrabee (Academic Press, New York, 1983).
F. M. d’Heurle, J. Mater. Res. 3, 167 (1988).
L. Zhang and D. G. Ivey, J. Appl. Phys. 71, 4314 (1992).
M. H. Wang and L. J. Chen, Appl. Phys. Lett. 58, 463 (1991).
W. Y. Hsieh, J. H. Lin, and L. J. Chen, Appl. Phys. Lett. 62, 1088 (1993).
W. Y. Liang and L. J. Chen, Appl. Phys. Lett. 64, 1224 (1994).
T. Nakanishi, M. Takeyama, and A. Noya, J. Appl. Phys. 77 (2), 948 (1995).
R. M. Walser and R. W. Bene, Appl. Phys. Lett. 28, 624 (1976).
F. M. d’Heurle, J. Mater. Res. 1, 205 (1986).
R. W. Bene, J. Appl. Phys. 61, 1826 (1987).
U. Gosele and K. N. Tu, J. Appl. Phys. 53, 3252 (1992).
R. Pretorius, Vacuum 41, 1038 (1990).
R. Pretorius, A. M. Vredenberg, and F. W. Saris, J. Appl. Phys. 70 (7), 3636 (1991).
Y. Mishima, M. Takei, T. Uematsu, N. Matsumoto, T. Kakehi, U. Wakino, and M. Okabe, J. Appl. Phys. 78 (1), 217.
R. W. Bene, J. Appl. Phys. 61, 1826 (1987).
Frans Spaepen, Acta Metall. 23, 729 (1975).
W. A. Miller and G. A. Chadwick, Acta Metall. 15, 609 (1967).
M. C. Inman and H. R. Tipler, Metall. Rev. 8, 105 (1963).
J. E. E. Baglin, F. M. d’Heurle, W. N. Hammer, and S. Petersson, Nucl. Instrum. Methods 168, 491 (1980).
F. R. Boer, R. Room, A. R. Miedema, and A. K. Niessen, Cohesion in Metals (North-Holland, Amsterdam, 1988).
R. Pretorius, R. de Reus, A. M. Vredenberg, and F. W. Saria, J. Appl. Phys. 70, 3636 (1991).
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Zhang, M., Wang, W.K. Phase formation sequence induced by deposition temperatures in Nb/Si multilayers. Journal of Materials Research 13, 1373–1378 (1998). https://doi.org/10.1557/JMR.1998.0195
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/JMR.1998.0195