Abstract
The development of crystallographic texture in hot-forged polycrystalline Bi2Te3 samples was studied. Texture was evaluated with the use of the March–Dollase model in conjunction with a Rietveld analysis of x-ray diffraction data. It was determined that during forging a strong (0001) texture develops along the loading axis. The magnitude of the (0001) texture increases systematically with the amount of height reduction during hot-forging. The correlation between the observed deformation and the March–Dollase texture model suggests that grain rotation is the primary mechanism for texture development in Bi2Te3.
Similar content being viewed by others
References
W. M. Yim, E. V. Fitzke, and F. D. Rosi, J. Mater. Sci. 1, 52–65 (1966).
S. Nakajima, J. Phys. Chem. Solids 24, 479–485 (1962).
H. J. Goldsmid, Thermoelectric Refrigeration (Plenum Press, New York, 1964), p. 109.
H. Wada, T. Sat, K. Takahashi, and N. Nakastukasa, J. Mater. Res. 5, 1052–1057 (1990).
F. K. Lotgering, J. Inorg. Nucl. Chem. 9, 113 (1959).
I. J. Ohsugi, T. Kojima, and I. A. Nishida, J. Appl. Phys. 68 (11), 5692–5695 (1990).
J. J. Ritter, Inorg. Chem. 33, 6419 (1994).
W. A. Dollase, J. Appl. Cryst. 19, 267–272 (1986).
R. A. Young, The Rietveld Method, edited by R. A. Young (Oxford University Press, Oxford, 1993).
A. C. Larson and R. B. Von Dreele; General Structure Analysis System, Rietveld Analysis Software, LANSCE, MS-H805, Los Alamos National Laboratory, NM 87545.
Powder Diffraction File (PDF), ICDD, Newton Square Corporate Campus, 12 Campus Blvd., Newton Square, PA 19073-3273.
M. H. Francombe, Brit. J. Appl. Phys. 9, 415–417 (1958).
S. Nakajima, J. Phys. Chem. Solids, 24, 479–485 (1963).
E. J. Gonzalez and G. White, unpublished work.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Gonzalez, E.J., Blendell, J.E., Cline, J.P. et al. Texture development in Bi2Te3 during hot forging. Journal of Materials Research 13, 766–773 (1998). https://doi.org/10.1557/JMR.1998.0097
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/JMR.1998.0097