Abstract
Rhombohedral Pb(Zr0.70Ti0.30)O3 thin films of four different well-defined textures, namely, (100), (111), bimodal (110)/(111), and (100)/(111), were prepared by a sol-gel method. The films were characterized in terms of grain size, presence of second phases, surface roughness, columnarity of grains, and other microstructural features. The dielectric, ferroelectric, and fatigue properties were investigated, with emphasis on the hysteresis switching characteristics. Results are discussed from the reference point of the allowable spontaneous polarization directions available for the different textures. The values of coercive field, remanent and saturation polarization, and slope of the loop at the coercive field, at saturating fields can be qualitatively explained based on the texture, independent of microstructural differences. The occurrence of surface pyrochlore, however, is observed to affect the functionality of the saturation curves, particularly for the samples of bimodal texture. Shearing of the hysteresis curves of the bimodal films is also attributed to surface microstructural features. The occurrence of nonswitching 71° or 109° domains in the (111) and (110)/(111) textured films is hypothesized based on a comparison with the data from the (100) textured film. Corrected saturation polarization values agree with the spontaneous polarization values of rhombohedral PZT single crystals and published calculated values for rhombohedral PZT ceramics. The fatigue characteristics show increases in the switching component of polarization in the range 103−107 bipolar cycles, particularly for the (111) textured sample. Onset of fatigue is observed for all samples between 107 and 108 switching cycles.
Similar content being viewed by others
References
C. A. Paz de Araujo, L. D. McMillan, B. M. Melnick, J. D. Cuchiaro, and J. F. Scott, Ferroelectrics 104, 241–256 (1990).
W. H. Shepherd, in Ferroelectric Thin Films, edited by E. R. Myers and A. I. Kingon (Mater. Res. Soc. Symp. Proc. 200, Pittsburgh, PA, 1990), pp. 277–288.
B. Jaffe, W. Cook, and H. Jaffe, Piezoelectric Ceramics (Academic Press, New York, 1971).
H. Watanabe, T. Mihara, and C. A. Paz de Araujo, Proc. 3rd Int. Symp. on Int. Ferroelectrics, Colorado Springs, CO (1991), pp. 139–150.
J. M. Benedetto, R. A. Moore, and F. B. McLean, J. Appl. Phys. 75, 460–466 (1994).
B. M. Melnick, C. A. Paz de Araujo, L. D. McMillan, D. A. Carver, and J. F. Scott, Ferroelectrics 116, 79–92 (1991).
W. Zhu, R. W. Vest, M. S. Tse, M. K. Rao, and Z. Q. Liu, Journal of Materials Science: Materials in Electronics (Chapman and Hall, New York, 1994), Vol. 5, pp. 173–179.
V. Chikarmane, J. Kim, C. Sudhama, J. Lee, A. Tasch, and S. Novak, J. Electron. Mater. 21, 503–512 (1992).
L. N. Chapin and S. A. Myers, in Ferroelectric Thin Films, edited by E. R. Myers and A. I. Kingon (Mater. Res. Soc. Symp. Proc. 200, Pittsburgh, PA, 1990), pp. 153–158.
S. A. Myers and L. N. Chapin, in Ferroelectric Thin Films, edited by E. R. Myers and A. I. Kingon (Mater. Res. Soc. Symp. Proc. 200, Pittsburgh, PA, 1990), pp. 231–236.
B. A. Tuttle, R. W. Schwartz, D. H. Doughty, and J. A. Voight, in Ferroelectric Thin Films, edited by E. R. Myers and A. I. Kingon (Mater. Res. Soc. Symp. Proc. 200, Pittsburgh, PA, 1990), pp. 159–165.
C. K. Kwok and S. B. Desu, in Ferroelectric Thin Films II, edited by A. I. Kingon, E. R. Myers, and B. Tuttle (Mater. Res. Soc. Symp. Proc. 200, Pittsburgh, PA, 1992), pp. 159–165.
I. M. Reaney, K. Brooks, R. Klissurska, C. Pawlaczyk, and N. Setter, J. Am. Ceram. Soc. 77 5, 1209–1216 (1994).
K. G. Brooks, I. M. Reaney, R. Klissurska, Y. Huang, L. Bursill, and N. Setter, J. Mater. Res. 9, 2540–2553 (1994).
K. R. Bellur, H. N. Al-Shareef, S. H. Rou, K. D. Gifford, O. Auciello, and A. I. Kingon, Proc. ISAF’92, IEEE, 448–451 (1992).
B. A. Tuttle, J. A. Voigt, T. J. Garino, D. C. Goodnow, R. W. Schwartz, D. L. Lamppa, T. J. Headley, and M. O. Eatough, Proc. 8th Int. Symp. Appl. Ferroelectrics, Greenville, SC, Aug. 31–Sept. 2, 1992, pp. 344–348.
B. A. Tuttle, T. J. Garino, J. A. Voigt, T. J. Headley, D. Dimos, and M. O. Eatough, in Science and Technology of Ferroelectric Thin Films (Kluwer Academic Publishers, The Netherlands, 1995), pp. 117–132.
P. K. Larsen, G. L. M. Kampschöer, M. B. van der Mark, and M. Klee, Proc. 8th Int. Symp. Appl. Ferroelectrics, Greenville, SC, Aug. 31–Sept. 2, 1992.
K. D. Budd, S. K. Dey, and D. A. Payne, Brit. Ceram. Proc. 36, 107–121 (1985).
K. G. Brooks, in Growth and Applications of Thin Films, edited by L. Eckertova and T. Ruzicka, Proc. Int. Summer School, June 20–25, 1994, Chlum u Trebone, Czech Republic (Prometheus Publishing, Prague, 1994).
G. B. Harris, Philos. Mag. 43, 113 (1952).
C. S. Barrett, Structure of Metals (McGraw-Hill, New York, 1953), pp. 203–205.
S. Chen and I. Chen, IMF Proc., August (1993).
T. Tani, Z. Xu, and D. A. Payne, in Ferroelectric Thin Films III, edited by E. R. Myers, B. A. Tuttle, S. B. Desu, and P. K. Larsen (Mater. Res. Soc. Symp. Proc. 310, Pittsburgh, PA, 1993), pp. 269–274.
M. Klee, A. De Veirman, P. Van de Weijer, U. Mackens, and H. Van Hal, Philips Res. Rep. 47, 263 (1993).
G. A. C. M. Spierings, J. B. A. van Zon, M. Klee, and P. K. Larsen, Proc. 4th Int. Symp. on Integrated Ferroelectrics, Monterey, CA, March 9–11, 1992.
V. Kaushik, P. Maniar, A. Campbell, R. Jones, R. Moazzami, C. J. Mogab, R. Hance, and R. Pyle, in Ferroelectric Thin Films III, edited by E. R. Myers, B. A. Tuttle, S. B. Desu, and P. K. Larsen (Mater. Res. Soc. Symp. Proc. 310, Pittsburgh, PA, 1993), pp. 209–214.
P. V. Lambeck and G. H. Jonker, Ferroelectrics 22, 729–731 (1978).
G. Arlt, in Science and Technology of Ferroelectric Thin Films (Kluwer Academic Publishers, The Netherlands, 1995), pp. 261–267.
A. K. Tagantsev, M. Landivar, E. Colla, K. G. Brooks, and N. Setter, in Science and Technology of Ferroelectric Thin Films (Kluwer Academic Publishers, The Netherlands, 1995), pp. 301–314.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Brooks, K.G., Klissurska, R.D., Moeckli, P. et al. Influence of texture on the switching behavior of Pb(Zr0.70Ti0.30)O3 sol-gel derived thin films. Journal of Materials Research 12, 531–540 (1997). https://doi.org/10.1557/JMR.1997.0076
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/JMR.1997.0076