Abstract
We report the electrical bistability of C60-tetracyanoquinodimethane (TCNQ) thin films fabricated by using an ionized-cluster-beam method in a high vacuum system. The films were characterized by transmission electron microscopy and electronic absorption spectroscopy. The spectroscopic results showed evidence of the formation of the charge-transfer complex system in C60-TCNQ thin films, and the TEM results revealed the microstructure of the films. The film thickness is ∼100 nm. The electromotive intensity at the transition point was of the order of 106 V/m. The possible mechanism of the electrical phenomena of the films is discussed in the paper.
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Gao, H.J., Xue, Z.Q., Wu, Q.D. et al. Fullerene-tetracyanoquinodimethane thin film and novel electrical bistability. Journal of Materials Research 11, 859–860 (1996). https://doi.org/10.1557/JMR.1996.0105
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DOI: https://doi.org/10.1557/JMR.1996.0105