Abstract
In this study, we described the first results from an x-ray reflectometer which has been modified from an existing Kratky small angle x-ray scattering (SAXS) camera at the UNM/Sandia scattering center. Typically, seven orders of magnitude of reflectivity can be obtained over a range of 0.02 to 0.5 Å−1 in q. This allows the resolution of surface features of 10 to 1000 Å. The conversion to reflectometer is reversible and can be achieved in a short time, allowing for dual use of an existing Kratky camera.
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Unpublished data, U of A data from J. A. Ruffner, with reflectometer (triple axis goniometer for θ/2θ scan) in C.M. Falco’s group.
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Hua, D.W., Beaucage, G. & Kent, M.S. From small angle x-ray scattering to reflectivity: Instrumentation and sample study. Journal of Materials Research 11, 273–276 (1996). https://doi.org/10.1557/JMR.1996.0031
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DOI: https://doi.org/10.1557/JMR.1996.0031