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From small angle x-ray scattering to reflectivity: Instrumentation and sample study

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Abstract

In this study, we described the first results from an x-ray reflectometer which has been modified from an existing Kratky small angle x-ray scattering (SAXS) camera at the UNM/Sandia scattering center. Typically, seven orders of magnitude of reflectivity can be obtained over a range of 0.02 to 0.5 Å−1 in q. This allows the resolution of surface features of 10 to 1000 Å. The conversion to reflectometer is reversible and can be achieved in a short time, allowing for dual use of an existing Kratky camera.

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Authors and Affiliations

  1. Center for Micro-Engineered Ceramics, University of New Mexico, University of New Mexico, Albuquerque, New Mexico, 87131-6041, USA

    D. W. Hua

  2. Department of Materials Science and Engineering, University of Cincinnati, Cincinnati, Ohio, 45221-0012, USA

    G. Beaucage

  3. Sandia National Laboratory, Albuquerque, New Mexico, 87185, USA

    M. S. Kent

Authors
  1. D. W. Hua
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  2. G. Beaucage
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  3. M. S. Kent
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Hua, D.W., Beaucage, G. & Kent, M.S. From small angle x-ray scattering to reflectivity: Instrumentation and sample study. Journal of Materials Research 11, 273–276 (1996). https://doi.org/10.1557/JMR.1996.0031

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  • DOI: https://doi.org/10.1557/JMR.1996.0031

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