Abstract
This paper describes a new application of two complementary surface characterization techniques to study solid-state bonding in an Al–Li alloy. Through the two mentioned techniques, Atomic Force Microscopy (AFM) and Secondary Ion Mass Spectrometry (SIMS), important findings about what takes place in the bond interface have been determined. These findings enclose both the formation of discontinuous mixed oxides and the evolution of Li through the bond line and into theadjacent diffusion affected zones. Homogenization of Li and Cu alloyelements has been detected even in those cases where a metallic interlayer was used to favor the union.
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Ureña, A., de Salazar, J.M.G., Martín, J.J. et al. Latest developments for microstructural and chemical characterization of diffusion bonding in superplastic 8090 Al–Li alloys. Journal of Materials Research 11, 63–71 (1996). https://doi.org/10.1557/JMR.1996.0009
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DOI: https://doi.org/10.1557/JMR.1996.0009