Abstract
Amorphous silicon germanium (a-SiGe) films, deposited on silicon substrates at room temperature in a molecular beam epitaxy system, were transformed into a single-crystal film and doped with phosphorus by exposure to KrF laser pulses. Electron channeling patterns showed that laser exposure resulted in crystallization of the undoped a-SiGe films. The SiGe films were doped by laser irradiation, using a phosphorus spin-on-dopant. The sheet resistance of the doped films decreased with increasing numbers of pulses, reaching a value of about ∼ 5 × 104 ohms/□ after 15 pulses. I-V data from mesa-type n-SiGe/p-Si diode devices were used to determine the effect of laser processing on the quality of the SiGe films.
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S. S. Iyer, G.L. Patton, J.C. Stork, Β. S. Meyerson, and D.L. Harame, IEEE Trans. Electron. Devices 36, 2043 (1989).
R. People, IEEE J. Quantum Electronics QE-22, 1696 (1986).
T.J. King, K. C. Saraswat, and J. R. Pñester, IEEE Electron. Device Lett. EDL-12, 584 (1991).
I.W. Wu, A. Chiang, M. Fuse, L. Ovecuglu, and T. Y. Huang, J. Appl. Phys. 65, 4036 (1989).
P. G. Carey, T.W. Sigmon, R.L. Press, and T. S. Fahlen, IEEE Electron Device Lett. EDL-6, 291 (1985).
J. Narayan, R. T. Young, R. F. Wood, and W. H. Christie, Appl. Phys. Lett. 33, 338 (1978).
G. Β. Turner, D. Tarrant, G. Pollock, R. Presley, and R. Press, Appl. Phys. Lett. 39, 967 (1981).
R. Z. Bachrach, K. Winer, J. B. Boyce, S. E. Ready, R. I. Johnson, and G. B. Anderson, J. Electron. Mater. 19, 241 (1990).
F. Foulan, E. Fogarassy, A. Slaoui, C. Fuchs, S. Unamuno, and P. Siffert, Appl. Phys. A45, 361 (1988).
S. Kato, H. Saeki, J. Wada, and S. Matsumoto, J. Electrochem. Soc. Solid State Sci. Technol. 135, 1030 (1988).
T. F. Deutsh, D.J. Ehrilch, D.D. Rathman, D.J. Silversmith, and R.M. Osgood, Appl. Phys. Lett. 39, 825 (1981).
A. Gat, L. Gerzberg, J. F. Gibbons, T. J. Magee, J. Peng, and J. D. Hong, Appl. Phys. Lett. 33, 775 (1978).
J. Narayan, C. W. White, M. J. Aziz, Β. Stritzker, and A. Walthuis, J. Appl. Phys. 57, 564 (1985).
J. Narayan and C.W. White, Appl. Phys. Lett. 44, 35 (1984).
J. Narayan, C.W. White, O.W. Holland, and M.J. Aziz, J. Appl. Phys. 56, 1821 (1984).
D. C. Joy, D. E. Newbury, and D. L. Davidson, J. Appl. Phys. 53, R81 (1982).
G. K. Chang, T. K. Cams, S. S. Rhee, and K. L. Wang, J. Electro-Chem. Soc. 138, 202 (1991).
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Krishnan, S., Chaudhry, M.I. & Babu, S.V. Doping and crystallization of amorphous SiGe films with an excimer (KrF) laser. Journal of Materials Research 10, 1884–1888 (1995). https://doi.org/10.1557/JMR.1995.1884
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DOI: https://doi.org/10.1557/JMR.1995.1884