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Doping and crystallization of amorphous SiGe films with an excimer (KrF) laser

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Abstract

Amorphous silicon germanium (a-SiGe) films, deposited on silicon substrates at room temperature in a molecular beam epitaxy system, were transformed into a single-crystal film and doped with phosphorus by exposure to KrF laser pulses. Electron channeling patterns showed that laser exposure resulted in crystallization of the undoped a-SiGe films. The SiGe films were doped by laser irradiation, using a phosphorus spin-on-dopant. The sheet resistance of the doped films decreased with increasing numbers of pulses, reaching a value of about ∼ 5 × 104 ohms/□ after 15 pulses. I-V data from mesa-type n-SiGe/p-Si diode devices were used to determine the effect of laser processing on the quality of the SiGe films.

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Krishnan, S., Chaudhry, M.I. & Babu, S.V. Doping and crystallization of amorphous SiGe films with an excimer (KrF) laser. Journal of Materials Research 10, 1884–1888 (1995). https://doi.org/10.1557/JMR.1995.1884

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  • DOI: https://doi.org/10.1557/JMR.1995.1884

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