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Morphological and structural properties of high quality YBCO thin films

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Abstract

High-quality YBCO thin films have been grown by Inverted Cylindrical Magnetron Sputtering (ICMS) on LaAlO3(100), SrTiO3(100), SrTiO3(110), and MgO(100) substrates. Transition temperatures of c-axis films exceed 90 K, and transition widths are within 1 K. Critical currents range up to 5 × 106 A/cm2 at 77 K. Structural and morphological features analyzed by x-ray diffraction and scanning electron microscopy, respectively, are found to be strongly dependent on film orientation and deposition temperature. In order to understand such dependence, a simple interpretation is proposed in terms of Gibbs energies and growth dynamics of the nucleation process.

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Authors and Affiliations

  1. Dip. Scienze Fisiche dell’Universitá, Federico II di Napoli, Italy

    A. Cassinese, A. Di Chiara, F. Miletto Granozio, U. Scotti di Uccio & M. Valentino

  2. Dip. di Ingegneria dei Materiali e della Produzione, Universitá Federico II di Napoli, Italy

    S. Saiello

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  6. M. Valentino
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Cassinese, A., Di Chiara, A., Miletto Granozio, F. et al. Morphological and structural properties of high quality YBCO thin films. Journal of Materials Research 10, 11–17 (1995). https://doi.org/10.1557/JMR.1995.0011

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