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X-ray diffraction analysis for thin films of PbTiO3-La2/3TiO3 prepared by the sol-gel method

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Abstract

Thin films in the system (1 - x) PbTiO3−xLa2/3TiO3 were prepared by the sol-gel and dip-coating methods. Phases deposited in the films and the lattice parameters as a function of the composition were investigated by the x-ray diffraction method. The solid solutions with a perovskite structure were formed as a single phase with x up to 0.9. For the composition of x = 1.0, metastable La-Ti-O perovskite phase with a small amount of the impurity phase, La2Ti2O7, was obtained. Simulation of x-ray diffraction patterns based on the defect structure model shows that the structure of the La-Ti-O perovskite phase includes randomly distributed cation vacancies at the A-site, namely (La2/3□1/3)TiO3.

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  1. Hyogo Prefectural Institute of Industrial Research, 3–1, Kobe, 654, Yukihira-cho, Suma-ku, Japan

    Hideki Yoshioka

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  1. Hideki Yoshioka
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Yoshioka, H. X-ray diffraction analysis for thin films of PbTiO3-La2/3TiO3 prepared by the sol-gel method. Journal of Materials Research 9, 2133–2137 (1994). https://doi.org/10.1557/JMR.1994.2133

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  • DOI: https://doi.org/10.1557/JMR.1994.2133

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