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Defect structure in single crystal titanium carbide

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Abstract

The defects and crystallinity of as-grown and annealed TiCx (grown by the high-pressure float-zone) were examined by TEM and double crystal x-ray rocking curves. Three types of subboundaries and planar defects within subgrains were observed in as-grown TiCx. Subboundaries are classified by structure as (i) wide-extended, fault-like defects (WEFLD’s), (ii) edge dislocation arrays, and (iii) dislocation networks. Planar defects were observed at dislocation nodes of subboundaries and also within subgrains; this is the first reported observation of planar defects within TiCx subgrains. The misorientation and/or density of subgrains in TiCx was reduced significantly by annealing at 2300 °C in contact with graphite.

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Authors and Affiliations

  1. Department of Materials Science and Engineering, Oregon Graduate Inst. of Science and Technology, Oregon, 20000 NW Walker Road, P.O. Box 91000, 97291–1000, Portland, USA

    Q. H. Zhao & D. Downham

  2. Department of Electrical Engineering and Applied Physics, Oregon Graduate Inst. of Science and Technology, Oregon, 20000 NW Walker Road, P.O. Box 91000, 97291–1000, Portland, USA

    J. Wu, A. K. Chaddha, H. S. Chen & J. D. Parsons

Authors
  1. Q. H. Zhao
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  2. J. Wu
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  3. A. K. Chaddha
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  4. H. S. Chen
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  5. J. D. Parsons
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  6. D. Downham
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Zhao, Q.H., Wu, J., Chaddha, A.K. et al. Defect structure in single crystal titanium carbide. Journal of Materials Research 9, 2096–2101 (1994). https://doi.org/10.1557/JMR.1994.2096

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  • DOI: https://doi.org/10.1557/JMR.1994.2096

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