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Microanalysis of crystalline phases in Tl-1223 superconducting wire using an x-ray microdiffractometer

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Abstract

We developed an x-ray microdiffractometer using synchrotron radiation with which we analyzed microcrystal structures of heterogeneities in Tl-1223 superconducting wires prepared by different processes, i.e., partial melt and solid/liquid phase reaction. Samples with the nominal composition (Tl0.5Pb0.5)1(Sr0.8Ba0.2)2Ca2Cu3O9 were irradiated by focused SR x-rays of 6 μm × 8 μm size. The diffracted x-rays were two-dimensionally detected with an imaging plate. From crystal structure analysis, we identified the heterogeneities as BaPbO3 and (CaSr)2Cu1O3 which are present in Tl-1223 superconducting wires prepared by both processes. This suggested that these heterogeneous phases coexist with the stable phase in the Tl-1223 phase diagram. Consequently, it is necessary to develop a new processing method such as low temperature annealing or a suitable O2 pressure control method.

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Authors and Affiliations

  1. Hitachi Research Laboratory, Hitachi Ltd., Ibaraki, Omika-cho 7-1-1, 319-12, Hitachi-shi, Japan

    Tatsumi Hirano & Katsuhisa Usami

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  1. Tatsumi Hirano
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  2. Katsuhisa Usami
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Hirano, T., Usami, K. Microanalysis of crystalline phases in Tl-1223 superconducting wire using an x-ray microdiffractometer. Journal of Materials Research 9, 1122–1125 (1994). https://doi.org/10.1557/JMR.1994.1122

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  • DOI: https://doi.org/10.1557/JMR.1994.1122

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