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Epitaxial LaNiO3 thin films: A normal metal barrier for SNS junction

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Abstract

Epitaxial LaNiO3 thin films have been grown on SrTiO3 and several other substrates by pulsed laser deposition. The films are observed to be metallic down to 15 K, and the temperature dependence of resistivity is similar to that of bulk LaNiO3. Epitaxial, c-axis oriented YBa2Cu3O7-x films with good superconducting properties have been grown on the LaNiO3 (100) films. I-V characteristics of the YBa2Cu3O7-x-LaNiO3 junction are linear, indicating ohmic contact between them.

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Authors and Affiliations

  1. Solid State and Structural Chemistry Unit, Indian Institute of Science, 560012, Bangalore, India, USA

    M. S. Hegde

  2. Department of Metallurgy, Indian Institute of Science, 560012, Bangalore, India, USA

    K. M. Satyalakshmi & R. M. Mallya

  3. Department of Physics, Center for Superconductivity Research, University of Maryland, 20742, College Park, Maryland, USA

    M. Rajeswari & H. Zhang

Authors
  1. M. S. Hegde
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  2. K. M. Satyalakshmi
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  3. R. M. Mallya
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  4. M. Rajeswari
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  5. H. Zhang
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Hegde, M.S., Satyalakshmi, K.M., Mallya, R.M. et al. Epitaxial LaNiO3 thin films: A normal metal barrier for SNS junction. Journal of Materials Research 9, 898–902 (1994). https://doi.org/10.1557/JMR.1994.0898

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  • DOI: https://doi.org/10.1557/JMR.1994.0898

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