Abstract
The use of transmission electron microscopy to study the interaction of lattice defects with surfaces of heat-treated ceramic materials is discussed. The approach used throughout the work described has been to prepare a thinned sample in a form suitable for imaging in the electron microscope and then to remove all preparation-induced damage by heat-treating the thinned sample. Applications of the technique to the movement and pinning of individual surface steps in alumina and the grooving of antiphase boundaries in silicon carbide are illustrated.
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Susnitzky, D.W., Carter, C.B. Defect/surface interactions in heat-treated ceramic thin films. Journal of Materials Research 6, 2403–2411 (1991). https://doi.org/10.1557/JMR.1991.2403
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DOI: https://doi.org/10.1557/JMR.1991.2403