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Ion beam analysis of laser-deposited high Tc YBa2Cu3O7 superconducting thin films

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Abstract

We have performed Rutherford backscattering spectrometry, non-Rutherford proton elastic scattering, and axial ion channeling analysis to determine the composition, the crystallinity, and the epitaxial quality of YBa2Cu3O7 superconducting thin films on (100) SrTiO3 and (100) yttria stabilized zirconia (YSZ) substrates. YBa2Cu3O7 superconducting thin films were fabricated both by high and low temperature laser ablation techniques. The former method requires high temperature annealing in oxygen to recover the superconducting properties, whereas in the latter method as-deposited in situ superconducting thin films are formed at low processing temperatures (500 °C–650 °C). Helium ions in the energy range of 2.0–2.5 MeV were used to determine the relative stoichiometries of the heavier atomic number elements (Y, Ba, Cu) in the film, but are not sensitive enough to determine the relative amount of oxygen in the superconducting phase. The detection sensitivities to oxygen can be greatly enhanced by using the proton elastic scattering [16O(p,p) 16O] reaction, which was found to increase the scattering cross section by a factor of 3 to 5 relative to the Rutherford scattering cross section. The ion-channeling of YBa2Cu3O7 superconducting thin films on (100) SrTiO3 substrates showed excellent minimum channeling yields corresponding to epitaxial growth, but the presence of defects increased the channeling yields for films deposited on (100) YSZ substrates. The ion channeling yields are compared with the microstructure of the films determined by transmission electron microscopy.

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References

  1. N. G. Stoffel, P. A. Morris, W. A. Bonner, and B. J. Wilkens, Phys. Rev. B 37, 2297 (1988).

    Article  CAS  Google Scholar 

  2. E. Rauhala, J. Keinonen, and R. Jarvinene, Appl. Phys. Lett. 52, 1520 (1988).

    Article  CAS  Google Scholar 

  3. J. Narayan, N. Biunno, R. K. Singh, O. Holland, and O. Auchiello, Appl. Phys. Lett. 51, 1845 (1987).

    Article  CAS  Google Scholar 

  4. F. L. Friere, Jr., C. V. Barros Leite, B. K. Patnaik, G. B. Baptista, D. Naugle, R. K. Pandey, and W. Kirk, J. Appl. Phys. 65, 400 (1989).

    Article  Google Scholar 

  5. W. K. Chu, J. W. Mayer, and M. A. Nicolet, Backscattering Spectrometry (Academic Press, New York, 1977).

    Google Scholar 

  6. G. Amsel, J. Nadai, E. D. Artemarte, D. David, E. Girard, and J. Moulin, Nucl. Instrum. Methods 92, 481 (1971).

    Article  CAS  Google Scholar 

  7. S. T. Picraux, Nucl. Instrum. Methods 149, 289 (1978).

    Article  CAS  Google Scholar 

  8. C. R. Gosset, Nucl. Instrum. Methods 218, 149 (1983).

    Article  Google Scholar 

  9. J. R. Cameroon, Phys. Rev. 90, 839 (1953).

    Article  Google Scholar 

  10. G. Amsel, Anal. Phys. 9, 247 (1964).

    Google Scholar 

  11. M. Luomajarvi, E. Rahuala, and M. Hautala, Nucl. Instrum. Methods B9, 258 (1985).

  12. B. R. Appleton and G. Foti, in Ion Beam Handbook for Materials Analysis, edited by J. W. Mayer and E. Rimini (Academic Press, New York, 1977).

  13. L. C. Feldman, J. W. Mayer, and S. T. Picraux, Materials Analysis by Ion Channeling (Academic Press, New York, 1982).

    Google Scholar 

  14. R. K. Singh, N. Biunno, and J. Narayan, Appl. Phys. Lett. 53, 1013 (1988).

    Article  CAS  Google Scholar 

  15. R. K. Singh, J. Narayan, A. K. Singh, and J. Krishnaswamy, Appl. Phys. Lett. 54, 2271 (1989).

  16. J. D. Jorgensen, M. A. Beno, D. G. Hinks, L. Soderholm, K. Volin, R. L. Hitterman, J. D. Grace, and I. V. Schuller, Phys. Rev. B 36, 3608 (1988).

    Article  Google Scholar 

  17. V. Y. Golovnya, A. P. Klyucharev, B. A. Shilayev, and N. A. Shlyakhov, Sov. J. Nucl. Phys. 4, 547 (1967).

    Google Scholar 

  18. R. P. Sharma, L. E. Rehn, P. M. Badlo, and J. Z. Liu, Phys. Rev. B 38, 9287 (1988).

    Article  CAS  Google Scholar 

  19. R. P. Sharma, L. E. Rehn, P. M. Badlo, and J. Z. Liu, Phys. Rev. Lett. 62, 2869 (1989).

    Article  CAS  Google Scholar 

  20. J. H. Barrett, Phys. Rev. B 3, 1527 (1971).

    Article  Google Scholar 

  21. J. Narayan, R. K. Singh, and J. D. Budai, Appl. Phys. Lett, (to be published).

  22. R. K. Singh, J. Narayan, and A. K. Singh, J. Appl. Phys. 67, 4558 (1990).

    Article  Google Scholar 

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  1. Rajiv K. Singh

    Present address: Department of Materials Science and Engineering, University of Florida, 32611, Gainesville, Florida, USA

Authors and Affiliations

  1. Department of Materials Science and Engineering, North Carolina State University, 27695-7916, Raleigh, North Carolina, USA

    Rajiv K. Singh & J. Narayan

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  1. Rajiv K. Singh
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  2. J. Narayan
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Singh, R.K., Narayan, J. Ion beam analysis of laser-deposited high Tc YBa2Cu3O7 superconducting thin films. Journal of Materials Research 5, 1793–1798 (1990). https://doi.org/10.1557/JMR.1990.1793

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  • DOI: https://doi.org/10.1557/JMR.1990.1793

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