Abstract
The grazing x-ray reflectrometry technique was used as a way to study modifications in metallic multilayers induced by ion-beam irradiation. Due to the high sensitivity of the technique, short-range atomic displacements of an atom A in a layer B can be detected so that the first stages of ion-beam mixing can be investigated. The rate of mixing is measured and the compound A1−xBx formed at the layers’ interfaces is characterized.
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Le Boité, M.G., Traverse, A., Névot, L. et al. Characterization of ion-beam mixed multilayers via grazing x-ray reflectometry. Journal of Materials Research 3, 1089–1096 (1988). https://doi.org/10.1557/JMR.1988.1089
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DOI: https://doi.org/10.1557/JMR.1988.1089