Abstract
The in-plane and c-axis structure of KHx—GIC’s and KDy—GIC’s is studied using transmission electron microscopy (TEM) and x-ray diffraction as a function of intercalation temperature and time. With the TEM, two commensurate in-plane phases are found to coexist in these compounds with relative concentrations depending on intercalation conditions. When the direct intercalation method is used, the first step of intercalation is the formation of a stage n potassium-GIC and the final compound is a stage n KHx—GIC (or KDy—GIC). Highresolution (00l) lattice images show direct evidence for intermediate phases in the intercalation process. These intermediate phases are hydrogen (deuterium) deficient and are found at the boundary between pure potassium regions and regions with high hydrogen (deuterium) content. A comparison of the structure for the two methods of intercalation of KH is also presented.
Similar content being viewed by others
References
M. S. Dresselhaus and G. Dresselhaus, Adv. Phys. 30, 139 (1981).
D. Guérard, C. Takoudjou, and F. Rousseaux, Synth. Met. 7, 43 (1983).
M. Colin and A. Hérold, Bull. Soc. Chirn. Fr., 1982 (1971).
D. Guérard, P. Lagrange, and A. Hérold, Mater. Sci. Eng. 31, 29 (1977).
N. C. Yeh, T. Enoki, L. E. McNeil, G. Roth, L. Salamanca-Riba, M. Endo, and G. Dresselhaus, MRS Extended Abstracts, Graphite Intercalation Compounds, edited by P. C. Eklund, M. S. Dresselhaus, and G. Dresselhaus (Materials Research Society, Pittsburgh, PA, 1984), p. 246.
L. Salamanca-Riba, Ph.D. thesis, Massachusetts Institute of Technology, Cambridge, MA, 1985.
J. C. H. Spence, Experimental High Resolution Electron Microscopy (Clarendon, Oxford, 1981).
N. C. Yeh, T. Enoki, L. Salamanca-Riba, and G. Dresselhaus, Extended Abstracts of the 17th Biennial Conference on Carbon, Lexington, June 1985, p. 194.
D. Guérard, N. E. Elalem, C. Takoudjou, and F. Rousseaux, Synth. Met. 12, 195 (1985).
G. L. Doll and P. C. Eklund (to be submitted for publication).
T. Enoki, N. C. Yeh, S. T. Chen, and M. S. Dresselhaus, Phys. Rev. B 33, 1292 (1986).
G. Timp, Ph.D. thesis, Massachusetts Institute of Technology, Cambridge, MA, 1983.
M. El Makrini, P. Lagrange, D. Guérard, and A. Hérold, Carbon 18, 211 (1980).
P. Lagrange, M. El Makrini, and A. Hérold, Rev. Chim. Minér. 20, 229 (1983).
L. Salamanca-Riba, N. C. Yeh, T. Enoki, M. S. Dresselhaus, and M. Endo, in Ref. 5, p. 249.
L. W. Hobbs, in Proceedings of the 25 th Scottish University Summer School in Physics, Glasgow, August 1983, edited by J. N. Chapman and A. J. Craven (SUSSP, Edinburgh, 1983), p. 399.
T. Trewern, R. K. Thomas, G. Naylor, and J. W. White, J. Chem. Soc, Faraday Trans. 1 78, 2369 (1982).
T. Trewern, R. K. Thomas, and J. W. White, J. Chem. Soc, Faraday Trans. 1 78, 2399 (1982).
M. Endo, T. C. Chieu, G. Timp, M. S. Dresselhaus, and B. S. Elman, Phys. Rev. B 28, 6982 (1983).
T. Enoki, H. Inokuchi, and M. Sano, in Ref. 5, p. 243.
Author information
Authors and Affiliations
Rights and permissions
About this article
Cite this article
Salamanca-Riba, L., Yeh, NC., Dresselhaus, M.S. et al. High-resolution transmission electron microscopy on KHx–GIC’s. Journal of Materials Research 1, 177–186 (1986). https://doi.org/10.1557/JMR.1986.0177
Received:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1557/JMR.1986.0177