Abstract
Strategies for the structurally identification of nanocrystals from Precession Electron Diffraction (PED) patterns in a Transmission Electron Microscope (TEM) are outlined. A single-crystal PED pattern may be utilized for the structural identification of an individual nanocrystal. Ensembles of nanocrystals may be fingerprinted structurally from “powder PED patterns”. Highly reliable “crystal orientation & structure” maps may be obtained from automatically recorded and processed scanning-PED patterns at spatial resolutions that are superior to those of the competing electron backscattering diffraction technique of scanning electron microscopy. The analysis procedure of that automated technique has recently been extended to Fourier transforms of high resolution TEM images, resulting in similarly effective mappings. Open-access crystallographic databases are mentioned as they may be utilized in support of our structural fingerprinting strategies.
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References
Moeck P.; Fraundorf P.: Zeits. Kristallogr. 222 (2007) 634–645, expanded version at: arXiv:0706.2021
Moeck P.; Rouvimov S.: in: Nano Particle Drug Delivery Systems: II Formulation and Characterization, Pathak Y. and Thassu D. (editors), Informa Health Care, New York, 2009, 268–311.
Moeck P.; Rouvimov S.: Zeits. Kristallogr. (2009) in press
Rouvimov S.; Rauch E. F.; Moeck P.; Nicolopoulos S.: Proc. NSTI 2009, Houston, Texas, in press
Moeck P.; Rouvimov S.: Proc. NSTI 2009, Houston, Texas, in press
Moeck P.; Rouvimov S.; Nicolopoulos S.: Proc. NSTI 2009, Houston, Texas, in press
Rauch E. F.; Véron M.; Portillo J.; Bultreys D.; Maniette Y.; Nicolopoulos S.: Microscopy and Analysis, Issue 93, November 2008, S5–S8.
Bjorge R.: MSc thesis, Portland State University, May 9, 2007; Journal of Dissertation Vol. 1 (2007), open access: http://www.scientificjournals.org/journals2007/j_of_dissertation.htm
Moeck P.; Bjorge R.: in: Quantitative Electron Microscopy for Materials Science, Eds. Snoeck E., DuninBorkowski R., Verbeeck J., and Dahmen U., Mater. Res. Soc. Symp. Proc. Vol. 1026E (2007), paper 1026–C17.
Moeck P.; Bjorge R.; Mandell E.; Fraundorf P.: Proc. NSTI-Nanotech Vol. 4 (2007) 93–96, (www.nsti.org, ISBN 1-4200637-6-6).
Rauch E. F.; Rouvimov S.; Nicolopoulos S.; Moeck P.: Proc. Microscopy & Microanalysis 2009, Richmond, Virginia, in press
Zou X. D.; Hovmöller S.: Acta Cryst. A 64 (2008) 149–160; open-access: http://journals.iucr.org/a/issues/2008/01/00/issconts.html
Dorset D. L.: Structural Electron Crystallography, Plenum Press, New York and London, 1995.
Vainshtein B. K.; Zvyagin B. B.: in: International Tables for Crystallography, Vol. B, Reciprocal space, Ed. Shmueli U., 2nd edition, Kluver Academic Publ., Dordrecht, 2001, pp. 306–320.
Vainshtein B. K.: Structure Analysis by Electron Diffraction, Pergamon Press Ltd., Oxford, 1964.
Blackman M.: Proc. Royal Society (London) A 173 (1939) 68–82.
Vincent R.; Midgley P.: Ultramicroscopy 53 (1994) 271–282.
Avilov A.; Kuligin K.; Nicolopoulos S.; Nickolskiy M.; Boulahya K.; Portillo J.; Lepeshov G.; Sobolev B.; Collette J. P.; Martin N.; Robins A. C.; Fischione P.: Ultramicroscopy 107 (2007) 431–444.
Klechkovskaya V. V.; Imamov R. M.: Crystallography Reports 46 (2001) 534–549.
Morniroli J. P.; Redjaïmia A.: J. Microsc. 227 (2007) 157–171.
Archer P. I.; Radovanovic P. V.; Heald S. M.; Gamelin D. R.: J. Am. Chem. Soc. 127 (2005) 14479–14487.
Bryan J. D.; Heald S. M.; Chambers S. A.; Gamelin D. R.: J. Am. Chem. Soc,. 126 (2004) 11640–11647.
Cowley J. M.: Progress in Materials Science, Vol. 13, 267–321, Eds. Chalmers B., and Hume-Rothery W., Pergamon Press, Oxford, 1967.
Faber J.; Fawcett T.: Acta Cryst. B 58 (2002) 325–332, http://www.icdd.com
Mighell A. D.; Karen V. L.: J. Res. Natl. Inst. Stand. Technol. 101 (1996) 273–280; NIST Standard Reference Database 3, http://www.nist.gov/srd/nist3.htm
http://www.fiz-karlsruhe.de/icsd.html, about 3, 600 entry on-line demo version freely accessible at: http://icsdweb.fiz-karlsruhe.de/
http://www.nist.gov/srd/nist83.htmand http://www.nist.gov/srd/nist84.htm (also free download of an about 3, 200 inorganics entry demo version of ref. [27]
http://www.crystalimpact.com/pcd/Default.htm, about 2,600 entry demo version for free download at: http://www.crystalimpact.com/pcd/download.htm
http://www.crystallography.netmirrored at: http://cod.ibt.lt (in Lithuania), http://cod.ensicaen.fr/ (in France) and http://nanocrystallography.org (in Oregon, USA), also accessible under a different search surface at: http://fireball.phys.wvu.edu/cod/ (in West Virginia, USA), some 75, 000 data sets
Gražulis S.; Chateigner D.; Downs R. T.; Yokochi A. F. T.; Quirós M.; Lutterotti L.; Manakova E.; Butkus J.; Moeck P.; Le Bail A.: J. Appl. Cryst., submitted
http://nanocrystallography.research.pdx.edu/CIF-searchable/cod.php, data on some 20, 000 crystals
http://rruff.geo.arizona.edu/AMS/amcsd.php, data on some 10, 000 minerals
http://crystdb.nims.go.jp, data on some 30, 000 metals and alloys
http://nanocrystallography.research.pdx.edu/index.py/group_links
Acknowledgments
This research was supported by awards from the Oregon Nanoscience and Microtechnologies Institute. Additional support from Portland State University's Venture Development Fund is acknowledged. Prof. Daniel R. Gamelin of the University of Washington at Seattle and Dr. Klaus H. Pecher of the Pacific Northwest National Laboratory are thanked for the cassiterite, rutile, and iron-oxide samples. Dr. Kurt Langworthy of the University of Oregon's Center for Advanced Materials Characterization in Oregon is thanked for his assistance in operating the aberration-corrected FEI Titan 80-300 microscope. Prof. Marie Cheynet of the Institut National Polytechnique de Grenoble is thanked for the HRTEM image of Fig. 6 (which was taken with an aberration-corrected FEI Titan 80-300 microscope in Grenoble) from PbSe nanocrystals that were produced by Dr. Odile Robbe of the Université de Lille.
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Moeck, P., Rouvimov, S., Rauch, E.F. et al. Structural Fingerprinting of Nanocrystals: Advantages of Precession Electron Diffraction, Automated Crystallite Orientation and Phase Maps. MRS Online Proceedings Library 1184, 1–12 (2009). https://doi.org/10.1557/PROC-1184-GG03-07
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DOI: https://doi.org/10.1557/PROC-1184-GG03-07