References
Anderson, T. F. (1952) A method for eliminating gross artifacts in drying specimens: Extrait du Congres De Microscopic Electronique, Editions de la Revue d’Optique. Section V, 567–576.
Gai, M. and Rich, C. I. (1972) Selectivity effect of cesium on clay size weathered mica; transmission electron microscopy studies: Clays and Clay Minerals 20, 175–379.
Güven, N. (1972) Electron optical observations on marble-head illite: Clays and Clay Minerals 20, 83–88.
Giiven, N. and Grim, R. E. (1972) X-Ray diffraction and electron optical studies on smectite and a-cristobalite associations: Clays and Clay Minerals 20, 89–92.
Jonas, E. C. and Oliver, R. M. (1967) Size and shape of montmorillonite crystallites: Clays and Clay Minerals 15, 27–33.
Mering, J. and Oberlin, A. (1967) Electron optical study of smectites: Clays and Clay Minerals 15, 3–25.
Roberson, H. E., Weir, A. H. and Woods, R. D. (1968) Morphology of particles in size-fractionated Na-montmoril-lonites: Clays and Clay Minerals 16, 239–247.
Uyeda, N., Hang, P. T. and Brindley, G. W. (1973) The nature of garnierites—II: electon optical study: Clays and Clay Minerals 21, 41–50.
Warren, D. C. and McAfee, J. L., Jr. (1968) A morphological study of selected synthetic clays by electron microscopy: Clays and Clay Minerals 16, 271–274.
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Jernigan, D.L., McAtee, J.L. Critical Point Drying of Electron Microscope Samples of Clay Minerals. Clays Clay Miner. 23, 161–162 (1975). https://doi.org/10.1346/CCMN.1975.0230212
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DOI: https://doi.org/10.1346/CCMN.1975.0230212