Abstract
This article first indicates the various types of temperature-induced oxygen isotopic exchange (OIE) that can occur between labeled gaseous O2 and solid oxides. Earlier main results of light-induced OIE with semiconductor oxides are then briefly reviewed. The core of the article reports new results about the use of light-induced OIE to assess (i) the lability of TiO2 surface O atoms, as altered by calcination or Se deposits, via the comparison of OIE with the photocatalytic removal of methanol in air and (ii) the accessibility of TiO2 affixed on a fiberglass material by means of a silica binder. Both this overview and these novel results illustrate the interest of OIE in heterogeneous photocatalysis.
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References
E. R. S. Winter, Faraday Soc. Discuss., 231 (1950).
E. R. S. Winter, J. Chem. Soc. A, 2889 (1968).
K. Klier, J. Novakova and P. Jiru, J. Catal. 2, 479 (1963).
J. Novakova, Catal. Rev. 4, 77 (1970).
G. K. Boreskov, Adv. Catal. 15, 285 (1964).
C. Doornkamp, M. Clement and V. Ponec, J. Catal. 182, 390 (1999).
C. Descorme and D. Duprez, Appl. Catal. A 202, 231 (2000).
M. Formenti, H. Courbon, F. Juillet, A. Lissatchenko, J. R. Martin, P. Meriaudeau and S. J. Teichner, J. Vacuum Sci. Technol. 9, 947 (1972).
S. Sato, J. Phys. Chem. 91, 2895 (1987).
J. Cunningham, E. L. Goold and E. M. Leahy, J. Chem. Soc. Faraday Trans. I 75, 305 (1979).
J. Cunningham, E. L. Goold and J. L. G. Fierro, J. Chem. Soc. Faraday Trans. I 78, 785 (1982).
J. Cunningham, B. Doyle, D. J. Morrissey and N. Samman, in: Proc. VIth Int. Congr. Catal., 1976, London, p. 1092 (1977).
H. Courbon and P. Pichat, Compt. Rend. Acad. Sci. Paris 285, 171 (1977).
G. Métrat, H. Courbon and P. Pichat, J. Phys. Chem. 96, 5491 (1992).
H. Courbon, M. Formenti and P. Pichat, J. Phys. Chem. 81, 550 (1977).
S. Sato, T. Kadowaki and K. Yamaguti, J. Phys. Chem. 88, 2930 (1984).
K. Tanaka and K. Miyahara, J. Phys. Chem. 7, 2303 (1974).
S. Sato and T. Kadowaki, J. Catal. 106, 295 (1987).
M. Anpo, Y. Kubokawa, T. Fujii and S. Suzuki, J. Phys. Chem. 88, 2572 (1984).
H. Courbon and P. Pichat, J. Chem. Soc., Faraday Trans. I 80, 3175 (1984).
Y. Yanagisawa, Appl. Surf. Sci. 115, 377 (1997).
J. Cunningham, in: Surface and Near Surface Chemistry of Oxide Materials, J. Nowotny (Ed.), p. 345. Elsevier, Amsterdam (1988).
T. T. Y. Tan, D. Beydoun and R. Amal, J. Mol. Catal. A: Chem. 202, 73 (2003).
T. T. Y. Tan, D. Beydoun and R. Amal, J. Phys. Chem. B 107, 4296 (2003).
Ahlstrom, French Patent No PCT/FR 99/00748 (1999).
H. Courbon, J.-M. Herrmann and P. Pichat, J. Phys. Chem. 88, 5210 (1984).
R. Enriquez, B. Beaugiraud and P. Pichat, Water Sci. Technol. 49, 147 (2004).
C. S. Turchi and D. F. Ollis, J. Catal. 122, 178 (1990).
M. W. Peterson, J. A. Turner and A. J. Nozik, J. Phys. Chem. 95, 221 (1991).
J. Cunningham, G. Al-Sayyed and S. Srijaranai, in: Aquatic and Surface Photochemistry, G. R. Helz, R. G. Zepp and D. G. Crosby (Eds), p. 317. Lewis, Boca Raton, FL (1994).
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Pichat, P., Courbon, H., Enriquez, R. et al. Light-induced isotopic exchange between O2 and semiconductor oxides, a characterization method that deserves not to be overlooked. Res. Chem. Intermed. 33, 239–250 (2007). https://doi.org/10.1163/156856707779238667
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DOI: https://doi.org/10.1163/156856707779238667