Abstract
The analysis of complex magnetic profiles throughout an ultrathin magnetic films by soft X-ray resonant magnetic reflectivity is discussed. Subnanometer resolution can be achieved allowing the separation of interface and inner layer magnetic contributions as well as the determination of antiferromagnetic and non-collinear spin structures. Reflectivity measurements are carried out up to large scattering angles allowing the determination of the depth-resolved profiles of the out-of-plane magnetic component.
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Tonnerre, J.M., Jal, E., Bontempi, E. et al. Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivity. Eur. Phys. J. Spec. Top. 208, 177–187 (2012). https://doi.org/10.1140/epjst/e2012-01618-y
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DOI: https://doi.org/10.1140/epjst/e2012-01618-y