Abstract
The element- and site-specificity of X-ray resonant magnetic scattering (XRMS) makes it an ideal tool for furthering our understanding of complex magnetic systems. In the hard X-rays, XRMS is readily applied to most antiferromagnets where the relatively weak resonant magnetic scattering (10−2–10−6 I c ) is separated in reciprocal space from the stronger, Bragg charge scattered intensity, I c . In ferro(ferri)magnetic materials, however, such separation does not occur and measurements of resonant magnetic scattering in the presence of strong charge scattering are quite challenging. We discuss the use of charge-magnetic interference resonant scattering for studies of ferromagnetic (FM) crystals and layered films. We review the challenges and opportunities afforded by this approach, particularly when using circularly polarized X-rays. We illustrate current capabilities at the Advanced Photon Source with studies aimed at probing site-specific magnetism in ferromagnetic crystals, and interfacial magnetism in films.
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Haskel, D., Kravtsov, E., Choi, Y. et al. Charge-magnetic interference resonant scattering studies of ferromagnetic crystals and thin films. Eur. Phys. J. Spec. Top. 208, 141–155 (2012). https://doi.org/10.1140/epjst/e2012-01615-2
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DOI: https://doi.org/10.1140/epjst/e2012-01615-2