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Photon path length distribution in random media from spectral speckle intensity correlations

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Abstract

We show that the spectral speckle intensity correlation (SSIC) technique can be profitably exploited to recover the path length distribution of photons scattered in a random turbid medium. We applied SSIC to the study of Teflon slabs of different thicknesses and were able to recover, via the use of the photon diffusion approximation theory, the characteristic transport mean free path ℓ∗ and absorption length s a of the medium. These results were compared and validated by means of complementary measurements performed on the same samples with standard pulsed laser time of flight techniques.

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Authors and Affiliations

  1. Departamento de Física, Cinvestav-IPN, Av. Instituto Politécnico Nacional 2508, 07360, México D.F., México

    L. F. Rojas & M. A. Escobedo-Sánchez

  2. Dipartimento di Fisica e Matematica, Università degli Studi dell’Insubria, via Valleggio 11, 22100, Como, Italy

    M. Bina & F. Ferri

  3. Dipartimento di Fisica, Università degli studi di Milano, via Celoria 16, 20133, Milano, Italy

    G. Cerchiari

  4. Department of Physics and Fribourg Center for Nanomaterials, University of Fribourg, 1700, Fribourg, Switzerland

    F. Scheffold

Authors
  1. L. F. Rojas
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  2. M. Bina
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  3. G. Cerchiari
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  4. M. A. Escobedo-Sánchez
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  5. F. Ferri
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  6. F. Scheffold
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Correspondence to F. Scheffold.

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Rojas, L.F., Bina, M., Cerchiari, G. et al. Photon path length distribution in random media from spectral speckle intensity correlations. Eur. Phys. J. Spec. Top. 199, 167–180 (2011). https://doi.org/10.1140/epjst/e2011-01512-2

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  • DOI: https://doi.org/10.1140/epjst/e2011-01512-2

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