Abstract.
The matrix nanocomposite described here is fabricated using a reactive melt infiltration process exploiting crystalline bismuth tellurite (Bi2TeO5) powder and porous silica dioxide (SiO2) matrix as original components. The original matrix, that is composed of regularly arranged amorphous SiO2 spheres, and is known as synthetic opal, reacts with the molten Bi2TeO5, forming three components (Bi2TeO5, bismuth orthosilicate (Bi4Si3O12), and \( \alpha\)-cristobalite) when cooled down to room temperature. The first two components can be considered as a set of nanocrystals with an average linear size more than 30nm and lattice parameters changed in comparison with those in a single crystal lattice. The \( \alpha\)-cristobalite component is formed rather as a network at the sites of amorphous SiO2 spheres whose presence in the obtained composite is not detected. A dominant role of bismuth ions in breaking the Si-O-Si bonds in a bridge-like structure of amorphous SiO2 spheres is proposed.
Similar content being viewed by others
References
J. Joannopoulos, Photonic Crystals: Molding the Flow of Light, 2nd ed. (Princeton University Press, Princeton and Oxford, 2008)
A. Blanco, C. Lopez, Annu. Rev. Nano Res. 1, 81 (2006)
E. Armstrong, C. O’Dwyer, J. Mater. Chem. 3, 6109 (2015)
D.A. Kurdyukov et al., Phys. Solid State 56, 1033 (2014)
A.S. Salasyuk et al., Phys. Solid State 52, 1170 (2010)
D.A. Kurdyukov et al., Phys. Solid State 58, 1216 (2016)
E.Yu. Stovpiaga et al., Phys. Solid State 59, 1623 (2017)
M. Derhachov et al., Acta Phys. Pol. A 113, 847 (2018)
V. Moiseienko, Springer Proceedings in Physics, edited by O. Fesenko, L. Yatsenko, Vol. 195 (Springer, Berlin, Heidelberg, 2017)
V.S. Gorelik et al., J. Adv. Dielectr. 7, 1750038 (2017)
B. Abu Sal et al., Ukr. J. Phys. Opt. 14, 119 (2013)
A.E. Aliev et al., Phys. Solid State 45, 61 (2003)
G.A. Emel’chenko et al., Semiconductors 39, 1328 (2005)
R.G. Shimmin et al., Chem. Mater. 19, 2102 (2007)
V. Moiseyenko et al., Ukr. J. Phys. Opt. 14, 225 (2013)
V. Moiseyenko et al., Ukr. J. Phys. Opt. 11, 2 (2010)
D.A. Kurdyukov, N.F. Kartenko, V.G. Golubev, J. Alloys Comps. 492, 611 (2010)
J.C. Lytle, A. Stein, Annu. Rev. Nano Res. 1, 1 (2006)
S.O. Yurchenko et al., J. Phys. D 50, 055105 (2017)
V.S. Gorelik et al., J. Russian Laser Res. 37, 254 (2016)
V.S. Gorelik et al., Inorg. Mater. 51, 419 (2015)
K.I. Zaytsev, S.O. Yurchenko, Appl. Phys. Lett. 105, 051902 (2014)
V.N. Moiseyenko et al., Opt. Spectr. 112, 198 (2012)
V.M. Masalov et al., Nanotechnology 22, 275718 (2011)
D. Mercurio et al., Mater. Chem. Phys. 9, 467 (1983)
K.M. Ok, S.P. Bhuvanesh, P. Shiv Halasyamani, Inorg. Chem. 40, 1978 (2001)
I. Földvári et al., Opt. Commun. 177, 105 (2000)
G. Mandula et al., Opt. Mater. 1, 161 (1992)
S. Stefanovich et al., Ferroelectrics 241, 303 (2000)
W. Stöber, A. Fink, E. Bohn, J. Coll. Interface Sci. 26, 62 (1968)
B.D. Cullity, Elements of X-ray diffraction, 2nd ed. (Addison-Wesley Publishing Company Inc., Reading, Massachusetts, 1978)
H. Liu, C. Kuo, J. Mater. Sci. Technol. 13, 145 (1997)
K.V. Domoratskii et al., Phys. Solid State 42, 1443 (2000)
R.S. Klein et al., J. Phys.: Condens. Matter 10, 3659 (1999)
B. Mihailova, M. Gospodinov, L. Konstantinov, J. Phys. Chem. Solids 60, 1821 (1999)
J.C. Champarnaud-Mesjard et al., J. Phys. Chem. Solids 61, 1499 (2000)
F.D. Hardcastle, I.E. Wachs, J. Solid State Chem. 97, 319 (1992)
K.J. Kingma, R.J. Hemly, Am. Mineral. 79, 269 (1994)
E. Denisov et al., Phys. Solid State 41, 1306 (1999)
Author information
Authors and Affiliations
Corresponding author
Additional information
Publisher’s Note
The EPJ Publishers remain neutral with regard to jurisdictional claims in published maps and institutional affiliations.
Rights and permissions
About this article
Cite this article
Derhachov, M., Moiseienko, V., Kutseva, N. et al. Fabrication and characterization of crystalline Bi2TeO5 - Bi4Si3O12 - SiO2 nanocomposite. Eur. Phys. J. Plus 134, 370 (2019). https://doi.org/10.1140/epjp/i2019-12898-0
Received:
Accepted:
Published:
DOI: https://doi.org/10.1140/epjp/i2019-12898-0