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Low energy electron attachment to formic acid

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The European Physical Journal D - Atomic, Molecular, Optical and Plasma Physics Aims and scope Submit manuscript

Abstract:

Using a high resolution electron energy monochromator low energy electron attachment to formic acid is studied for the first time by means of mass spectrometric detection of the product anions. The largest dissociative electron attachment (DA) cross-section produces HCOO -+H with weaker channels for OH- and O- becoming apparent at higher incident energies.

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Authors and Affiliations

  1. Institut für Ionenphysik der Leopold Franzens Universität, Technikerstrasse 25, 6020 Innsbruck, Austria, , , , , , AT

    A. Pelc, W. Sailer, P. Scheier, N.J. Mason & T.D. Märk

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  1. A. Pelc
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  2. W. Sailer
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  3. P. Scheier
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  4. N.J. Mason
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  5. T.D. Märk
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Received 23 January 2002 and Received in final form 9 February 2002 Published online 13 September 2002

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Pelc, A., Sailer, W., Scheier, P. et al. Low energy electron attachment to formic acid. Eur. Phys. J. D 20, 441–444 (2002). https://doi.org/10.1140/epjd/e2002-00140-1

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  • DOI: https://doi.org/10.1140/epjd/e2002-00140-1

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