Abstract.
Ballistic electron emision microscopy spectra have been measured at room temperature on Au films deposited on the Si(111)-H surface by different procedures. In order to analyze them in detail, we propose a fully analytical description of these spectra, directly based on the phase-space model of Bell and Kaiser. This allows fitting experimental data over a wide voltage range, comprising the threshold and the quasi-linear regions. Two main independent parameters are extracted from the fits, namely the effective Schottky barrier height and hot-electron transmission of the sample. These show a clear variation with sample preparation conditions.
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Thiaville, A., Caud, F., Vouille, C. et al. BEEM spectra of various Au-Si samples and their analysis. Eur. Phys. J. B 55, 29–36 (2007). https://doi.org/10.1140/epjb/e2007-00037-3
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DOI: https://doi.org/10.1140/epjb/e2007-00037-3