Abstract.
The transition from amorphous to polycrystalline microstructure has been studied in sputtered Co x Si1-x alloy films by structural, magneto-optical and Nuclear Magnetic Resonance measurements. For \(x \geq 0.76\), Si is diluted into Co without significantly altering the polycrystalline microstructure, composed of a mixture of hcp and fcc grains. However, the fraction of Co atoms that contribute to the Nuclear Magnetic Resonance signal is found to decrease steeply (down to about 60\(\%\) at x = 0.76) suggesting a microscopic segregation of a Si rich phase that induces a large degree of disorder. This is reflected in a harder magnetic behavior and a strong anisotropy dispersion. Below x = 0.75, the transition to an amorphous microstructure results in a sudden increase in the fraction of Co atoms within a ferromagnetic phase, indicating the recovery of the microscopic homogeneity. Also a significant enhancement of the macroscopic magnetic anisotropy is found for amorphous films with compositions right below the transition. Within the amorphous phase a second regime of Si segregation appears characterized by a constant Co local environment and constant magnetic properties. Finally, for x = 0.65 there is a significant Si enrichment in the Co environment and the films become non magnetic for compositions below this point.
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Received: 26 July 2004, Published online: 5 November 2004
PACS:
75.50.Kj Amorphous and quasicrystalline magnetic materials - 75.30.Gw Magnetic anisotropy - 76.60.-k Nuclear magnetic resonance and relaxation
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Vélez, M., Mény, C., Valvidares, S.M. et al. Amorphous to polycrystalline transition in Co\(\mathsf{_x}\)Si \(\mathsf{_{1-x}}\) alloy thin films. Eur. Phys. J. B 41, 517–524 (2004). https://doi.org/10.1140/epjb/e2004-00345-0
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DOI: https://doi.org/10.1140/epjb/e2004-00345-0