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Noise correction for roughening analysis of magnetic flux profiles in YBa\(_\mathsf{2}\)Cu\(_\mathsf{3}\)O\(_\mathsf{7-x}\)

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Abstract.

The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent \(\alpha = 0.75(6)\). The growth exponent of the profiles is \(\beta = 0.7(1)\).

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Authors and Affiliations

  1. Division of Physics and Astronomy, Faculty of Sciences, Vrije Universiteit, De Boelelaan 1081, 1081HV, Amsterdam, The Netherlands

    M. S. Welling, C. M. Aegerter & R. J. Wijngaarden

Authors
  1. M. S. Welling
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  2. C. M. Aegerter
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  3. R. J. Wijngaarden
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Correspondence to M. S. Welling.

Additional information

Received: 9 February 2004, Published online: 20 April 2004

PACS:

05.65. + b Self-organized systems - 45.70.-n Granular systems

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Welling, M.S., Aegerter, C.M. & Wijngaarden, R.J. Noise correction for roughening analysis of magnetic flux profiles in YBa\(_\mathsf{2}\)Cu\(_\mathsf{3}\)O\(_\mathsf{7-x}\) . Eur. Phys. J. B 38, 93–98 (2004). https://doi.org/10.1140/epjb/e2004-00103-4

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  • DOI: https://doi.org/10.1140/epjb/e2004-00103-4

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