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Genetic Algorithms as a tool in the study of aperiodic order, with application to the case of X-Ray diffraction spectra of GaAs-AlAs multilayer heterostructures

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Abstract:

We present the first application of Genetic Algorithms to the analysis of data from an aperiodically ordered system, high resolution X-Ray diffraction spectra from multilayer heterostructures arranged according to a deterministic or random scheme. This method paves the way to the solution of the “inverse problem”, that is the retrieval of the generating disorder from the investigation of the spectra of an unknown sample having non crystallographic, non quasi-crystallographic order.

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Received 18 March 2002 / Received in final form 3 July 2002 Published online 31 October 2002

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ID="a"e-mail: Evelyne.Lutton@inria.fr

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ID="b"CNRS UMR 8502

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Leblanc, B., Lutton, E. & Axel, F. Genetic Algorithms as a tool in the study of aperiodic order, with application to the case of X-Ray diffraction spectra of GaAs-AlAs multilayer heterostructures. Eur. Phys. J. B 29, 619–628 (2002). https://doi.org/10.1140/epjb/e2002-00345-0

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  • DOI: https://doi.org/10.1140/epjb/e2002-00345-0

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