Abstract
The development of a method for exploring the ultrafast transient dynamics in small organized structures with high spatial resolution is expected to be a basis for further advances in current science and technology. Recently, we have developed a new microscopy technique by combining scanning tunneling microscopy (STM) with ultrashort-pulse laser technology, which enables the visualization of ultrafast carrier dynamics even on the single-atomic level. A nonequilibrium carrier distribution is generated using ultrashort laser pulses and its relaxation processes are probed by STM using the optical pump-probe method realized in STM by the pulse-picking technique. In this paper, the fundamentals of the new microscopy technique are overviewed.
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References
- 1.
G. Binning, H. Rohrer, H, Ch. Gerber, E. Weibel, Phys. Rev. Lett. 49, 57 (1982)
- 2.
R. Wisendanger, Scanning Probe Microscopy and Spectroscopy (Cambridge University Press, Cambridge, 1994)
- 3.
M. Berthe, R. Stiufiuc, B. Grandidier, D. Deresmes, C. Delerue, D. Stiévenard, Science 319, 436 (2008)
- 4.
D. Kitchen, A. Richardella, J.-M. Tang, M.E. Flatté, A. Yazdani, Nature 442, 436 (2006)
- 5.
M.-X. Wang, et al., Science 336, 52 (2012)
- 6.
A.A. Khajetoorians, B. Chilian, J. Wiebe, S. Schuwalow, F. Lechermann, R. Wiesendanger, Nature 467, 1084 (2010)
- 7.
T. Komeda, H. Isshiki, J. Liu, Y.–F. Zhang, N. Lorente, K. Katoh, B.K. Breedlove, M. Yamashita, Nat. Commun. 2, 217 (2011)
- 8.
T. Okuda, T. Eguchi, K. Akiyama, A. Harasawa, T. Kinoshita, Y. Hasegawa, M. Kawamori, Y. Haruyama, S. Matsui, Phys. Rev. Lett. 102, 105503 (2009)
- 9.
H.J. Mamin, H. Birk, P. Wimmer, D. Rugar, J. Appl. Phys. 75, 161 (1994)
- 10.
U. Kemiktarak, T. Ndukum, K.C. Schwab, K.L. Ekinci, Nature 450, 85 (2007)
- 11.
S. Weiss, D.F. Ogletree, D. Botkin, M. Salmeron, D.S. Chemla, Appl. Phys. Lett. 63, 2567 (1993)
- 12.
G. Nunes Jr, M.R. Freeman, Science 262, 1029 (1993)
- 13.
I. Moult, M. Herve, Y. Pennec, Appl. Phys. Lett. 98, 233103 (2011)
- 14.
S. Loth, M. Etzkorn, C.P. Lutz, D.M. Eigler, A.J. Heinrich, Science 329, 1628 (2010)
- 15.
R.J. Hamers, David G. Cahill, Appl. Phys. Lett. 57, 2031 (1990)
- 16.
S.W. Wu, W. Ho, Phys. Rev. B. 82, 085444 (2010)
- 17.
I. Moult, M. Herve, Y. Pennec, Appl. Phys. Lett. 98, 233013 (2011)
- 18.
C. Saunus, J.R. Bindel, M. Pratzer, M. Morgenstern, Appl. Phys. Lett. 102, 051601 (2013)
- 19.
O. Takeuchi, M. Aoyama, R. Oshima, Y. Okada, H. Oigawa, N. Sano, H. Shigekawa, R. Morita, M. Yamashita, Appl. Phys. Lett. 85, 3268 (2004)
- 20.
M. Yamashita, H. Shigekawa, R. Morita, Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy-Route to Femtosecond Angstrom Technology (Springer, Berlin, Heidelberg, 2005)
- 21.
O. Takeuchi, M. Aoyama, H. Shigekawa, Jpn. J. Appl. Phys. 44, 5354 (2005)
- 22.
Y. Terada, S. Yoshida, O. Takeuchi, H. Shigekawa. J. Phys. Cond. Mat. 22, 264008 (2010)
- 23.
H. Shigekawa, S. Yoshida, O. Takeuchi, M. Aoyama, Y. Terada, H. Kondo, H. Oigawa, Thin Solid Films 516, 2348 (2008)
- 24.
Y. Terada, S. Yoshida, O. Takeuchi, H. Shigekawa, Nature Photonics 4, 869 (2010)
- 25.
Y. Terada, S. Yoshida, O. Takeuchi, H. Shigekawa, Adv. Opt. Tech. 2011, 510186 (2011)
- 26.
S. Yoshida, Y. Terada, R. Oshima, O. Takeuchi, H. Shigekawa, Nanoscale 4, 757 (2012)
- 27.
S. Yoshida, Y. Terada, M. Yokota, O. Takeuchi, Y. Mera, H. Shigekawa, Appl. Phys. Exp. 6, 016601 (2013)
- 28.
H. Shigekawa, O. Takeuchi, Y . Terada, S. Yoshida, Series: Handbook of Nanophysics, vol. 6, Principles and Methods, edited by Klaus Sattler (Taylor & Francis, New York, 2010)
- 29.
S. Yoshida, M. Yokota, O. Takeuchi, H. Oigawa, Y. Mera, H. Shigekawa, Appl. Phys. Exp. 6, 032401 (2013)
- 30.
J. Shah, Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures (Springer, Berlin, Heidelberg, 1999)
- 31.
S. Grafström, J. Appl. Phys. 91, 1717 (2002)
- 32.
S. Gupta, M.Y. Frankel, J.A. Valdmanis, J.F. Whitaker, G.A. Mourou, F.W. Smith, A.R. Calawa, Appl. Phys. Lett. 59, 3276 (1991)
- 33.
M. McEllistrem, G. Haase, D. Chen, R.J. Hamers, Phys. Rev. Lett. 70, 2471 (1993)
- 34.
R.M. Feenstra, Y. Dong, M.P. Semtsiv, W.T. Masselink, Nanotechnology 18, 044015 (2007)
- 35.
O. Takeuchi, S. Yoshida, H. Shigekawa, Appl. Phys. Lett. 84, 3645 (2004)
- 36.
S. Yoshida, Y. Kanitani, R. Oshima, Y. Okada, O. Takeuchi, H. Shigekawa, Phys. Rev. Lett. 98, 026802 (2007)
- 37.
Ch. Sommerhalter, Th.W. Matthes, J. Boneberg, P. Leiderer, M. Ch. Lux-Steiner, J. Vac. Sci. Technol. B 15, 1876 (1997)
- 38.
H. Ohno, in Semiconductor Spintronics and Quantum Computation, edited by D.D. Awschalom, N. Samarth, and D. Loss (Springer, Berlin, 2002)
- 39.
A. Richardella, D. Kitchen, A. Yazdani, Phys. Rev. B. 80, 045318 (2009)
- 40.
H. Oigawa, M. Yokota, T. Kishizawa, S. Yoshida, O. Takeuchi, H. Shigekawa, Abstracts 20th International Colloquium on Scanning Probe Microscopy, Okinawa (2012), p. 108
- 41.
H. Oigawa, J.-F. Fan, Y. Nannichi, K. Ando, K. Saiki, A. Koma, Jpn. J. Appl. Phys. 28, L340 (1989)
- 42.
J.J. Gu, A.T. Neal, P.D. Ye, Appl. Phys. Lett. 99, 152113 (2011)
- 43.
S. Tsukamoto, N. Koguchi, Appl. Phys. Lett. 65, 2199 (1994)
- 44.
H. Shigekawa, H. Oigawa, K. Miyake, Y. Aiso, Y. Nannichi, T. Hashizume, T. Sakurai, Appl. Phys. Lett. 65, 607 (1994)
- 45.
H. Shigekawa, H. Hashizume, H. Oigawa, K. Motai, Y. Mera, Y. Nannichi, T. Sakurai, Appl. Phys. Lett. 59, 2986 (1991)
- 46.
H. Sugahara, M. Oshima, H. Oigawa, H. Shigekawa, Y. Nannichi, J. Appl. Phys. 69, 4349 (1991)
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Yoshida, S., Terada, Y., Yokota, M. et al. Optical pump-probe scanning tunneling microscopy for probing ultrafast dynamics on the nanoscale. Eur. Phys. J. Spec. Top. 222, 1161–1175 (2013). https://doi.org/10.1140/epjst/e2013-01912-2
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Keywords
- GaAs
- European Physical Journal Special Topic
- Scan Tunneling Microscopy
- Pump Pulse
- Probe Pulse