The European Physical Journal Special Topics

, Volume 163, Issue 1, pp 9–18 | Cite as

Ultracold strontium clock: Applications to the measurement of fundamental constant variations

  • A. D. Ludlow
  • S. Blatt
  • T. Zelevinsky
  • G. K. Campbell
  • M. J. Martin
  • J. W. Thomsen
  • M. M. Boyd
  • J. Ye
Article

Abstract

We describe the application of high accuracy Srspectroscopy to the measurement of the variation of thefundamental constants of nature. We first describe recent progressof the JILA Sr optical frequency standard, with a systematicuncertainty evaluation at the 10-16 fractional frequencylevel. Using recent internationally based measurements of the Srclock frequency, we show improved constraints of gravitational andtemporal changes in the fine structure constant and theelectron-proton mass ratio. Finally, we describe how ultracoldatomic strontium, confined in an optical lattice, can beassociated into molecular dimers and be used for amodel-independent measurement of the variation of theelectron-proton mass ratio.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. S.G. Karshenboim, V.V. Flambaum, E. Peik, Handbook of Atomic, Molecular and Optical Physics (Springer, 2005), p. 455Google Scholar
  2. S.N. Lea, Rep. Prog. Phys. 70, 1473 (2007)Google Scholar
  3. V.V. Flambaum, M.G. Kozlov, Phys. Rev. Lett. 98, 240801 (2007)Google Scholar
  4. E. Reinhold, et al., Phys. Rev. Lett. 96, 051101 (2006)Google Scholar
  5. T.P. Heavner, S.R. Jefferts, E.A. Donley, J.H. Shirley, T.E. Parker, Metrologia 42, 411 (2005)Google Scholar
  6. S. Bize, et al., J. Phys. B 38, S449 (2005)Google Scholar
  7. E.J. Angstmann, V.A. Dzuba, V.V. Flambaum (2004) [arXiv:physics/0407141v1]Google Scholar
  8. A.D. Ludlow, et al., Phys. Rev. Lett. 96, 033003 (2006)Google Scholar
  9. R. Le Targat, et al., Phys. Rev. Lett. 97, 103003 (2006)Google Scholar
  10. M. Takamoto, et al., J. Phys. Soc. Jpn. 75, 104302(2006)Google Scholar
  11. M.M. Boyd, et al., Phys. Rev. Lett. 98, 083002 (2007)Google Scholar
  12. X. Baillard, et al., published online EpJD DOI: 10.1140/epjd/e2007-00330-3 (2007)Google Scholar
  13. G.K. Campbell, et al. (in preparation)Google Scholar
  14. T. Zelevinsky, S. Kotochigova, J. Ye, Phys. Rev. Lett. 100, 043201 (2008)Google Scholar
  15. T. Zelevinsky, et al., Phys. Rev. Lett. 96, 203201 (2006)Google Scholar
  16. P.G. Mickelson, et al., Phys. Rev. Lett. 95, 223002 (2005)Google Scholar
  17. A.D. Ludlow, et al., Science (accepted)Google Scholar
  18. W.H. Oskay, et al., Phys. Rev. Lett. 97, 020801 (2006)Google Scholar
  19. H.S. Margolis, et al., Science 306, 1355 (2004)Google Scholar
  20. T. Schneider, E. Peik, C. Tamm, Phys. Rev. Lett. 94, 230801 (2005)Google Scholar
  21. Z.W. Barber, et al., Phys. Rev. Lett. 96, 083002 (2006)Google Scholar
  22. T. Rosenband, et al., Science (accepted)Google Scholar
  23. M.M. Boyd, et al., Phys. Rev. A 76, 022510 (2007)Google Scholar
  24. H. Katori, et al., Phys. Rev. Lett. 91, 173005 (2003)Google Scholar
  25. T. Mukaiyama, et al., Phys. Rev. Lett. 90, 113002 (2003)Google Scholar
  26. T. Loftus, et al., Phys. Rev. Lett. 93, 073003 (2004)Google Scholar
  27. G. Wilpers, et al., Metrologia 44, 146 (2007)Google Scholar
  28. C. Degenhardt, et al., Phys. Rev. A 75, 062111 (2005)Google Scholar
  29. M. Takamoto, et al., Nature 435, 321 (2005)Google Scholar
  30. D. Leibfried, R. Blatt, C. Monroe, D. Wineland, Rev. Mod. Phys. 75, 281 (2003)Google Scholar
  31. H. Hachisu, et al., Phys. Rev. Lett. 100, 053001 (2008)Google Scholar
  32. R.W.P. Drever, et al., Appl. Phys. B 31, 97 (1983)Google Scholar
  33. M. Notcutt, et al., Opt. Lett. 30, 1815 (2005)Google Scholar
  34. A.D. Ludlow, et al., Opt. Lett. 32, 641 (2007)Google Scholar
  35. K. Numata, A. Kemery, J. Camp, Phys. Rev. Lett. 93, 250602 (2004)Google Scholar
  36. M.M. Boyd, et al., Science 314, 1430 (2006)Google Scholar
  37. S.M. Foreman, et al., Phys. Rev. Lett. 99, 153601 (2007)Google Scholar
  38. C.W. Oates, et al., IEEE Inter. Freq. Control SymposiumExposition, 74 (2006)Google Scholar
  39. S.G. Porsev, A. Derevianko, Phys. Rev. A 74, 020502R (2006)Google Scholar
  40. S.M. Foreman, et al., Rev. Sci. Instrum. 78, 021101 (2007)Google Scholar
  41. S. Blatt, et al., Phys. Rev. Lett. (accepted)Google Scholar
  42. V.V. Flambaum, A.F. Tedesco, Phys. Rev. C 73, 055501 (2006)Google Scholar

Copyright information

© EDP Sciences and Springer 2008

Authors and Affiliations

  • A. D. Ludlow
    • 1
  • S. Blatt
    • 1
  • T. Zelevinsky
    • 1
  • G. K. Campbell
    • 1
  • M. J. Martin
    • 1
  • J. W. Thomsen
    • 1
  • M. M. Boyd
    • 1
  • J. Ye
    • 1
  1. 1.JILA, National Institute of Standards and Technology and University of Colorado 440 UCBBoulderUSA

Personalised recommendations