Advertisement

Residual stress in Ni-Mn-Ga thin films deposited on different substrates

  • S. Doyle
  • V. A. Chernenko
  • S. Besseghini
  • A. Gambardella
  • M. Kohl
  • P. Müllner
  • M. Ohtsuka
Article

Abstract.

Four series of Ni51.4Mn28.3Ga20.3/substrate thin film composites, where the substrate is either Si(100), MgO(100), alumina or Mo foil, and two series of Ni53.5Mn23.8Ga22.7/substrate composites where the substrate is either alumina or Mo foil, with different film thicknesses varying from 0.1 to 5 μm have been studied in the cubic phase by XRD stress measurements. The values of residual stresses are found to be dependent on both substrate and film thickness. In the submicron range, a correlation between thickness dependencies of residual stress and transformation temperatures is experimentally obtained. The temperature dependence of the d-spacing d220 is studied for the films deposited on Si(100).

Keywords

Residual Stress Martensitic Transformation Transformation Temperature European Physical Journal Special Topic Residual Stress Measurement 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. M. Wuttig, C. Craciunescu, J. Li, Mater. Trans. JIM 41, 933 (2000) Google Scholar
  2. H. Rumpf, J. Feydt, D. Levandovski, A. Ludwig, B. Winzek, E. Quandt, P. Zhao, M. Wuttig, Proc. SPIE 5053, 191 (2003) Google Scholar
  3. J.W. Dong, Q.J. Xie, J. Lu, C. Adelmann, C.J. Palmstrøm, J. Cui, Q. Pan, T.W. Shield, R.D. James, S. McKernan, J. Appl. Phys. 95, 2593 (2004) Google Scholar
  4. J. Dubowik, Y.V. Kudryavtsev, Y.P. Lee, J. Appl. Phys. 95, 2912 (2004) Google Scholar
  5. V.A. Chernenko, M. Ohtsuka, M. Kohl, V.V. Khovailo, T. Takagi, Smart Mater. Struct. 14, S245 (2005) Google Scholar
  6. V.A. Chernenko, R. Lopez Anton, M. Kohl, M. Otsuka, I. Orue, J.M. Barandiaran, J. Phys. Condens. Matter 17, 5215 (2005) Google Scholar
  7. M. Kohl, V.A. Chernenko, M. Ohtsuka, H. Reuter, T. Takagi, Mater. Res. Soc. Symp. Proc. 855E, W2.8.1 (2005) Google Scholar
  8. V.A. Chernenko, M. Kohl, V.A. L'vov, V.M. Kniazkyi, M. Ohtsuka, O. Kraft, Mater. Trans. 47, 619 (2006) Google Scholar
  9. V.A. Chernenko, M. Kohl, S. Doyle, P. Müllner, M. Ohtsuka, Scr. Mater. 54, 1287 (2006) Google Scholar
  10. M. Kohl, A. Agarwal, V.A. Chernenko, M. Ohtsuka, K. Seemann, Mater. Sci. Eng. A 438-440, 940 (2006) Google Scholar
  11. V.A. Chernenko, S. Doyle, M. Kohl, P. Müllner, S. Besseghini, M. Ohtsuka, Z. Kristall (2007) (in print) Google Scholar
  12. S. Besseghini, A. Gambardella, V.A. Chernenko, M. Hagler, C. Pohl, P. Müllner, M. Ohtsuka, S. Doyle, Eur. Phys. J. Special Topics 158, 179 (2008) Google Scholar
  13. V.A. Chernenko, S. Besseghini, M. Hagler, P. Müllner, M. Ohtsuka, F. Stortiero, Mater. Sci. Eng. A (2007) [doi:10.1016/j.msea.2006.12.206] Google Scholar
  14. A.L. Roytburd, T.S. Kim, Q. Su, J. Slutsker, M. Wuttig, Acta Mater. 46, 5095 (1998) Google Scholar
  15. H.T. Hesemann, P. Müllner, O. Kraft, E. Arzt, J. Phys. (France) 112, 107 (2003) Google Scholar
  16. O. Kraft, H. Hommel, E. Arzt, Mater. Sci. Eng. A 288, 209 (2000) Google Scholar
  17. I.C. Noyan, L.B. Cohen, Residual Stress: Measurement by Diffraction and Interpretation (Springer-Verlag, New York, 1987) Google Scholar
  18. P.S. Previy, Developments in Materials Characterization Technologies, edited by G. Vander Voort, J. Friel (ASM International, Materials Park, Ohio, 1996), p. 103 Google Scholar
  19. M. Hagler, V.A. Chernenko, M. Ohtsuka, S. Besseghini, P. Müllner, MRS Spring Meeting, Symposium J (to be published in electronic format) Google Scholar
  20. W.D. Nix, Met. Trans. A 20, 2217 (1989) Google Scholar
  21. W.D. Nix, Scr. Mater. 39, 545 (1998) Google Scholar
  22. R.-M. Keller, S.P. Baker, E. Arzt, J. Mater. Res. 13, 1307 (1998) Google Scholar
  23. B. von Blanckenhagen, E. Arzt, P. Gumbsch, Acta Mater. 52, 773 (2004) Google Scholar
  24. M. Wuttig, Y. Zheng, J.S. Slutsker, K. Mori, Q. Su, Scr. Mater. 41, 529 (1999) Google Scholar

Copyright information

© EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2008

Authors and Affiliations

  • S. Doyle
    • 1
  • V. A. Chernenko
    • 2
    • 3
  • S. Besseghini
    • 3
  • A. Gambardella
    • 3
  • M. Kohl
    • 4
  • P. Müllner
    • 5
  • M. Ohtsuka
    • 6
  1. 1.ANKA, Forschungszentrum KarlsruheKarlsruheGermany
  2. 2.Institute of MagnetismKievUkraine
  3. 3.CNR-IENILeccoItaly
  4. 4.IMT, Forschungszentrum KarlsruheKarlsruheGermany
  5. 5.Department of Materials Science and EngineeringBoise State UniversityBoiseUSA
  6. 6.IMRAM, Tohoku UniversitySendaiJapan

Personalised recommendations