Advertisement

The European Physical Journal E

, Volume 12, Issue 3, pp 375–381 | Cite as

Capillary instabilities by fluctuation induced forces

  • M. D. Morariu
  • E. Schäffer
  • U. SteinerEmail author
Article

Abstract.

The spontaneous break-up of thin films is commonly attributed to the destabilizing effect of van der Waals forces. Dispersion forces can be considered in terms of the confinement of the electromagnetic fluctuation spectrum. The principle of confinement is more general than the usual argument of interacting dipole fluctuations. It includes also disjoining pressures that are caused by thermal fluctuations. In this context, we review recent publications on the dewetting of thin polymer films, and argue that the presence of an acoustic disjoining pressure is necessary to adequately describe some of these experimental results.

Keywords

Polymer Thin Film Polymer Film Thermal Fluctuation Destabilize Effect 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    Lord Rayleigh, Proc. London Math. Soc. 10, 4 (1897)Google Scholar
  2. 2.
    J.R. Melcher, Field-Coupled Surface Waves (MIT Press, Cambridge, Mass., 1963)Google Scholar
  3. 3.
    A. Vrij, Discuss. Faraday Soc. 42, 23 (1966)Google Scholar
  4. 4.
    A. Scheludko, Adv. Colloid Interface Sci. 1, 392 (1967)Google Scholar
  5. 5.
    E. Ruckenstein, R.K. Jain, J. Chem. Soc. Faraday Trans. II 70, 132 (1974)Google Scholar
  6. 6.
    C. Redon, F. Brochard-Wyart,F. Rondelez, Phys. Rev. Lett. 66, 715 (1991)CrossRefGoogle Scholar
  7. 7.
    R. Xie, A. Karim, J.F. Douglas, C.C. Han, R.A. Weiss, Phys. Rev. Lett. 81, 1251 (1998)CrossRefGoogle Scholar
  8. 8.
    J. Bischof, D. Scherer, S. Herminghaus, P. Leiderer, Phys. Rev. Lett. 77, 1536 (1996)CrossRefGoogle Scholar
  9. 9.
    G. Reiter, A. Sharma, R. Khanna, A. Casoli, M.-O. David, J. Colloid Interface Sci. 214, 126 (1999)CrossRefGoogle Scholar
  10. 10.
    G. Reiter, A. Sharma, A. Casoli, M.-O. David, R. Khanna, P. Auroi, Langmuir 15, 2551 (1999)CrossRefGoogle Scholar
  11. 11.
    S. Herminghaus, Phys. Rev. Lett. 83, 2359 (1999)CrossRefGoogle Scholar
  12. 12.
    E. Schäffer, T. Thurn-Albrecht, T.P. Russell, U. Steiner, Nature 403, 874 (2000)CrossRefGoogle Scholar
  13. 13.
    E. Schäffer, T. Thurn-Albrecht, T.P. Russell, U. Steiner, Europhys. Lett. 53, 518 (2001)CrossRefGoogle Scholar
  14. 14.
    E. Schäffer, S. Harkema, R. Blossey, U. Steiner, Europhys. Lett. 60, 255 (2002)CrossRefGoogle Scholar
  15. 15.
    E. Schäffer, S. Harkema, R. Blossey, U. Steiner, Macromolecules 36, 1645 (2003)CrossRefGoogle Scholar
  16. 16.
    K.Y. Suh, H.H. Lee, Phys. Rev. Lett. 87, 135502-1 (2001)CrossRefGoogle Scholar
  17. 17.
    K. Dalnoki-Veress, B.G. Nickel, J.R. Dutcher, Phys. Rev. Lett. 82, 1486 (1999)CrossRefGoogle Scholar
  18. 18.
    E. Schäffer, U. Steiner, Eur. Phys. J. E 8, 347 (2002)Google Scholar
  19. 19.
    H.B.G. Casimir, Proc. Kon. Ned. Akad. Wetensch. 51, 793 (1948)zbMATHGoogle Scholar
  20. 20.
    M. Kadar, R. Golestanian, Rev. Mod. Phys. 71, 1233 (1999)CrossRefGoogle Scholar
  21. 21.
    F. London, Trans. Faraday Soc. 33, 8 (1937)Google Scholar
  22. 22.
    D. Kleppner, Phys. Today 43, 9 (1990)Google Scholar
  23. 23.
    J.N. Israelachvili, Intermolecular and surface forces (Academic Press, London, 1991)Google Scholar
  24. 24.
    C.J. Morath, H.J. Maris, Phys. Rev. B 54, 203 (1996)CrossRefGoogle Scholar
  25. 25.
    H.-L. Zhang, D.G. Bucknall, G. Andrew, D. Briggs, Third Conference on Scanning Probe Microscopy of Polymers, 15-18 July 2003, Kerkrade, The NetherlandsGoogle Scholar
  26. 26.
    R. Seemann, S. Herminghaus, K. Jacobs, Phys. Rev. Lett. 86, 5534 (2001)CrossRefGoogle Scholar
  27. 27.
    P. Lambooy, K.C.Phelan, O. Haugg, G. Krausch, Phys. Rev. Lett, 76, 1110 (1996)Google Scholar
  28. 28.
    M. Sferrazza, M. Heppenstall-Butler, R. Cubitt, D. Bucknall, J. Webster, R.A.L. Jones, Phys. Rev. Lett. 81, 5173 (1998)CrossRefGoogle Scholar
  29. 29.
    F. Brochard-Wyart, F. Daillant, Can. J. Phys. 68, 1084 (1990)Google Scholar
  30. 30.
    E.M. Lifshitz, Sovjet Phys. JETP 2, 73 (1956)Google Scholar
  31. 31.
    I.E. Dzyaloshinskii, E.M. Lifshitz, L.P. Piaevskii, Adv. Phys. 10, 165 (1961)zbMATHGoogle Scholar
  32. 32.
    H. Kaya, B. Jérôme, Eur. Phys. J. E 12, 383 (2003)Google Scholar
  33. 33.
    U. Thiele, Eur. Phys. J. E 12, 409 (2003)Google Scholar
  34. 34.
    H. Richardson, C. Carelli, J.L. Keddie, M. Sferrazza, Eur. Phys. J. E 12, 437 (2003)Google Scholar

Copyright information

© Springer-Verlag Berlin/Heidelberg 2004

Authors and Affiliations

  1. 1.Materials Science CenterUniversity of GroningenGroningenThe Netherlands
  2. 2.Max Planck Institute of Molecular Cell Biology and GeneticsDresdenGermany

Personalised recommendations