The European Physical Journal D

, Volume 51, Issue 2, pp 173–177 | Cite as

Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip

  • A. Emmert
  • A. Lupaşcu
  • G. Nogues
  • M. Brune
  • J.-M. Raimond
  • S. Haroche
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Abstract

We have measured the trapping lifetime of magnetically trapped atoms in a cryogenic atom-chip experiment. An ultracold atomic cloud is kept at a fixed distance from a thin gold layer deposited on top of a superconducting trapping wire. The lifetime is studied as a function of the distances to the surface and to the wire. Different regimes are observed, where loss rate is determined either by the technical current noise in the wire or the Johnson-Nyquist noise in the metallic gold layer, in good agreement with theoretical predictions. Far from the surface, we observe exceptionally long trapping times for an atom-chip, in the 10 min range.

PACS

03.75.Be Atom and neutron optics 37.10.Gh Atom traps and guides 67.85.-d Ultracold gases, trapped gases 

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Copyright information

© EDP Sciences, SIF, Springer-Verlag Berlin Heidelberg 2009

Authors and Affiliations

  • A. Emmert
    • 1
  • A. Lupaşcu
    • 1
  • G. Nogues
    • 1
  • M. Brune
    • 1
  • J.-M. Raimond
    • 1
  • S. Haroche
    • 1
    • 2
  1. 1.Laboratoire Kastler Brossel, ENS, CNRSParis Cedex 05France
  2. 2.Collège de France, 11 place Marcelin BerthelotParis Cedex 05France

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