Advertisement

The European Physical Journal D

, Volume 48, Issue 1, pp 3–10 | Cite as

Absolute frequency measurements of wavelength standards 532 nm, 543 nm, 633 nm and 1540 nm

  • P. BallingEmail author
  • P. Křen
Topical issue: Metrology and optical frequency combs

Abstract.

This paper describes the results of absolute frequency measurements of primary wavelength standards 633 nm, 543 nm, 532 nm, (iodine stabilized) and 1540 nm (acetylene stabilized) in CMI. The values obtained with Menlo Systems femtosecond frequency comb in CMI are compared with previous measurements of the same standards in BIPM, BEV and MPQ. Measured sub-Doppler linewidths and relative intensities of several hyperfine spectral components of iodine molecule are also presented.

PACS.

42.62.Fi Laser spectroscopy 42.62.Eh Metrological applications; optical frequency synthesizers for precision spectroscopy 06.30.Ft Time and frequency 

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. R. Felder, Metrologia 42, 323 (2005) http://www.bipm.org/en/committees/cc/ccl/mep.html CrossRefADSGoogle Scholar
  2. J. Reichert, M. Niering, R. Holzwarth, M. Weitz, Th. Udem, T.W. Hänsch, Phys. Rev. Lett. 84, 3232 (2000) CrossRefADSGoogle Scholar
  3. D.J. Jones, S.A. Diddams, J.K. Ranka, A. Stentz, R.S. Windeler, J.L. Hall, S.T. Cundiff, Science 288, 635 (2000) CrossRefADSGoogle Scholar
  4. P. Balling, P. Křen, in digest of the Conference on Precision Electromagnetic Measurement 2006, Torino, ISBN 88-7992-228-9, pp. 304–305 (poster WeP_9) Google Scholar
  5. M. Matus, The CCL Workshop on Comb Technology 2003 http://www.bipm.org/utils/en/pdf/Michael_Matus.pdf Google Scholar
  6. M. Matus, P. Balling, M. Šmíd, J. Walczuk, E. Bánréti, K. Tomanyiczka, GH. Popescu, A. Chartier, J.-M. Chartier, Metrologia 39, 83 (2002) CrossRefADSGoogle Scholar
  7. P. Balling, P. Křen, in digest of the Conference on Precision Electromagnetic Measurement 2004, ISBN 0-7803-8493-8, pp. 215–216, (poster Tu4c33) Google Scholar
  8. Long Sheng Ma, S. Picard, M. Zucco, J.-M. Chartier, L. Robertsson, P. Balling, P. Kren, Jin Qian, Zhong You Lin, Chunying Shi, M. Viliesid Alonso, Gan Xu, Siew Leng Tan, K. Nyholm, J. Henningsen, J. Hald, R. Windeler, IEEE Trans. Instr. Meas. 55, 3 (2006) CrossRefGoogle Scholar
  9. S. Picard, L. Robertsson, L.-S. Ma, K. Nyholm, M. Merimaa, T.E. Ahola, P. Balling, P. Křen, J.-P. Wallerand, Appl. Optics 42, 6 (2003) Google Scholar
  10. P. Balling, J. Blabla, A. Chartier, J.-M. Chartier, M. Ziegler, IEEE Trans. Instr. Meas. 44, 173 (1995) CrossRefGoogle Scholar
  11. H. Wahlquist, J. Chem. Phys. 305, 1708 (1961) CrossRefADSGoogle Scholar
  12. P. Balling, J. Blabla, IEEE Trans. Instr. Meas. 47, 1481 (1998) CrossRefGoogle Scholar
  13. W.Y. Cheng, J.T. Shy, J. Opt. Soc. Am. B 18, 363 (2001) CrossRefADSGoogle Scholar
  14. U. Brand, Opt. Commun. 100, 361 (1993) CrossRefADSGoogle Scholar
  15. P. Balling, P. Křen, in WDS'05 Proceedings, Contributed Papers: Part III–Physics, edited by J. Safrankova (Matfyz press, 2005), p. 590 http://www.mff.cuni.cz/veda/konference/wds/ contents/pdf05/WDS05_104_f6_Balling.pdf Google Scholar
  16. P. Balling, M. Fischer, P. Kubina, R. Holzwarth, Opt. Express 13, 9196 (2005) CrossRefADSGoogle Scholar

Copyright information

© EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2007

Authors and Affiliations

  1. 1.Laboratories of fundamental metrologyCzech Metrology InstitutePraha 5Czech Republic

Personalised recommendations