Low energy electron attachment to C60

  • V. S. Prabhudesai
  • D. Nandi
  • E. KrishnakumarEmail author
Fundamental Processes in the Gas Phase


Low energy electron attachment to the fullerene molecule (C60) and its temperature dependence are studied in a crossed electron beam–molecular beam experiment. We observe the strongest relative signal of C60 anion near 0 eV electron energy with respect to higher energy resonant peaks confirming the contribution of s-wave capture to the electron attachment process and hence the absence of threshold behavior or activation barrier near zero electron energy. While we find no temperature dependence for the cross-section near zero energy, we observe a reduction in the cross-sections at higher electron energies as the temperature is increased, indicating a decrease in lifetime of the resonances at higher energies with increase in temperature.


Fullerene Electron Energy Molecular Beam Quantum Computing Activation Barrier 
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© EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2005

Authors and Affiliations

  1. 1.Tata Institute of Fundamental ResearchMumbaiIndia

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