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A study of small impact parameter ion channeling effects in thin crystals

  • Mallikarjuna Rao Motapothula
  • Mark B. H. Breese
Regular Article

Abstract

We have recorded channeling patterns produced by 1–2 MeV protons aligned with ⟨1 1 1⟩ axes in 55 nm thick silicon crystals which exhibit characteristic angular structure for deflection angles up to and beyond the axial critical angle, ψ a . Such large angular deflections are produced by ions incident on atomic strings with small impact parameters, resulting in trajectories which pass through several radial rings of atomic strings before exiting the thin crystal. Each ring may focus, steer or scatter the channeled ions in the transverse direction and the resulting characteristic angular structure beyond 0.6ψ a at different depths can be related to peaks and troughs in the nuclear encounter probability. Such “radial focusing” underlies other axial channeling phenomena in thin crystals including planar channeling of small impact parameter trajectories, peaks around the azimuthal distribution at small tilts and large shoulders in the nuclear encounter probability at tilts beyond ψ a .

Keywords

Solid State and Materials 

Supplementary material

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Copyright information

© EDP Sciences, SIF, Springer-Verlag GmbH Germany, part of Springer Nature 2018

Authors and Affiliations

  • Mallikarjuna Rao Motapothula
    • 1
    • 2
  • Mark B. H. Breese
    • 1
    • 3
  1. 1.Center for Ion Beam Applications, Physics Department, National University of SingaporeSingaporeSingapore
  2. 2.NUSNNI-NanoCore, National University of SingaporeSingaporeSingapore
  3. 3.Singapore Synchrotron Light Source (SSLS), National University of SingaporeSingaporeSingapore

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