High-quality in situ manganite thin films by pulsed laser deposition at low background pressures

  • A. TebanoEmail author
  • G. Balestrino
  • N. G. Boggio
  • C. Aruta
  • B. Davidson
  • P. G. Medaglia
Solid and Condensed State Physics


We show that by decreasing the laser fluence it is possible to improve the oxidation process in manganite thin films under low background oxygen pressure, allowing the in situ use of conventional Reflection High Energy Electron Diffraction diagnostic. Films deposited at low fluence (corresponding to a deposition rate per pulse lower than 10-2 unit cells per laser shot) show a two-dimensional growth mode and possess very good transport properties without the necessity of any further post-growth annealing treatment. A physical model, based on the plume-background interaction as a primary mechanism of film oxidation during growth, is proposed to explain the experimental findings.


79.20.Ds Laser-beam impact phenomena 81.15.Fg Laser deposition 75.70.-i Magnetic properties of thin films, surfaces, and interfaces 


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  1. O. Moràn, R. Hott, K. Grube, D. Fuchs, R. Schneider, E. Baca, W. Saldarriaga, P. Prieto, J. Appl. Phys. 95, 6239 (2004) CrossRefADSGoogle Scholar
  2. J. Eckstein, I. Bozovic, Ann. Rev. Mat. Sci. 25, 679 (1995) CrossRefGoogle Scholar
  3. S. Jin, M. Mc Cormack, T.H. Tiefel, R. Ramesh, J. Appl. Phys. 76, 6929 (1994) CrossRefADSGoogle Scholar
  4. G. Koster, G.J.H.M. Rijnders, D.H.A. Blank, H. Rogalla, Appl. Phys. Lett. 74, 3729 (1999) CrossRefADSGoogle Scholar
  5. X.D. Zhu, W. Si, X.X. Xi, Q. Jiang, Appl. Phys. Lett. 78, 460 (2001) CrossRefADSGoogle Scholar
  6. W. Prellier, A.M. Haghiri-Gosnet, B. Mercey, Ph. Lecoeur, M. Hervieu, Ch. Simon, B. Raveau, Appl. Phys. Lett. 77, 1023 (2000) CrossRefADSGoogle Scholar
  7. G.C. Xiong, Q. Li, H.L. Ju, R.L. Greene, T. Venkatesan, Appl. Phys. Lett. 66, 1689 (1995) CrossRefADSGoogle Scholar
  8. J. O'Donnel, J.N. Eckstein, M.S. Rzchowski, Appl. Phys. Lett. 76, 218 (2000) CrossRefADSGoogle Scholar
  9. J. O'Donnell, M. Onellion, M.S. Rzchowsky, J.N. Eckstein, I. Bozovic, Phys. Rev. B 54, 6841 (1996) CrossRefADSGoogle Scholar
  10. A.Yu. Petrov, C. Aruta, S. Mercone, C. Adamo, I. Alessandri, L. Maritato, Eur. Phys. J. B 40, 11 (2004) CrossRefADSGoogle Scholar
  11. J.Y. Gu, K.H. Kim, T.W. Noh, K.S. Suh, J. Appl. Phys. 78, 6151 (1995) CrossRefADSGoogle Scholar
  12. J.Q. Guo, H. Takeda, N.S. Kazama, K. Fukamichi, M. Tachiki, J. Appl. Phys. 81, 7445 (1997) CrossRefADSGoogle Scholar
  13. R. von Helmolt, J. Wecker, B. Holzapfel, L. Schultz, K. Samwer, Phys. Rev. Lett. 71, 2331 (1993) CrossRefADSGoogle Scholar
  14. M. McCormack, S. Jin, T.H. Tiefel, R.M. Fleming, J.M. Phillips, R. Ramesh, Appl. Phys. Lett. 64, 3045 (1994) CrossRefADSGoogle Scholar
  15. W. Prellier, B. Mercey, P. Lecouer, J. Phys. Cond. Matter. 48, 915 (2001) CrossRefGoogle Scholar
  16. M. Izumi, Y. Konishi, T. Nishihara, S. Hayashi, L.M. Shinohara, M. Kawasaki, Y. Tokura, Appl. Phys. Lett. 73, 2497 (1998) CrossRefADSGoogle Scholar
  17. J. Klein, C. Hofener, Y. Lu, J. Klein, M.S.R. Rao, B.H. Freitag, W. Mader, L. Alff, R. Gross, J. Mag. Mag. Mater. 211, 9 (2000) CrossRefADSGoogle Scholar
  18. J. Klein, J.B. Philipp, G. Carbone, A. Vigliante, L. Alff, R. Gross, Phys. Rev. B 66, 052414 (2002) CrossRefADSGoogle Scholar
  19. J. Klein, J.B. Philipp, D. Reisinger, L. Alff, R. Gross, Phys. Stat. Sol. (a) 189, 617 (2002) CrossRefADSGoogle Scholar
  20. M. Angeloni, C. Aruta, G. Balestrino, P. Orgiani, A. Tebano, P.G. Medaglia, Eur. Phys. J. B 29, 561 (2002) CrossRefADSGoogle Scholar
  21. M. Angeloni, G. Balestrino, N. Boggio, P.G. Medaglia, P. Orgiani, A. Tebano, J. Appl. Phys. 96, 6387 (2004) CrossRefADSGoogle Scholar
  22. J. Dho, N.H. Hur, I.S. Kim, Y.K. Park, J. Appl. Phys. 94, 7670 (2003) CrossRefADSGoogle Scholar
  23. S. Amoruso, B. Toftmann, J. Schou, Phys. Rev. E 69, 056403 (2004) CrossRefADSGoogle Scholar
  24. C. Altucci, R. Bruzzese, C. de Lisio, M. Nisoli, S. Stagira, S. De Silvestri, O. Svelto, A. Boscolo, P. Ceccherini, L. Poletto, G. Tondello, P. Villoresi, Phys. Rev. A 61, 21801 (1999) CrossRefGoogle Scholar
  25. R.F. Wood, K.R. Chen, J.N. Leboeuf, A.A. Puretzky, D.B. Geohegan, Phys. Rev. Lett. 79, 1571 (1997) CrossRefADSGoogle Scholar
  26. T.E. Itina, J. Hermann, P. Delaporte, M. Sentis, Phys. Rev. E 66, 066406 (2002) CrossRefADSGoogle Scholar

Copyright information

© EDP Sciences/Società Italiana di Fisica/Springer-Verlag 2006

Authors and Affiliations

  • A. Tebano
    • 1
    Email author
  • G. Balestrino
    • 1
  • N. G. Boggio
    • 1
  • C. Aruta
    • 1
  • B. Davidson
    • 2
  • P. G. Medaglia
    • 1
  1. 1.CNR-INFM-COHERENTIA and Dipartimento di Ingegneria Meccanica, Università di Roma “Tor Vergata”RomaItaly
  2. 2.CNR-INFM-TASC National LaboratoryBasovizza (TS)Italy

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