Optical characterization of ferroelectric Bi \(\mathsf{_{3.25}}\)La \(\mathsf{_{0.75}}\)Ti\(\mathsf{_{3}}\)O \(\mathsf{_{12}}\) thin films

  • Z. G. Hu
  • Z. M. Huang
  • Y. N. Wu
  • S. H. Hu
  • G. S. Wang
  • J. H. Ma
  • J. H. Chu
Article

Abstract.

Amorphous and crystalline Bi3.25La0.75Ti3O12 (BLT) thin films on vitreous silica and sapphire substrates are prepared from chemical solutions. Their optical properties are investigated by transmittance measurements at energies from 1.1 to 5.0 eV. A four-phase model consisting of air, surface rough layer, BLT, and substrate is used to simulate the measured transmittance spectra. The inverse synthesis method with a double Tauc-Lorentz (DTL) dispersion function is used to calculate the optical constants and film thicknesses. The dispersion of the refractive index in the transparent region agrees with Sellmeier’s dispersion relation. The absorption edges of the BLT films are different in the amorphous and crystalline cases.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    B.H. Park, B.S. Kang, S.D. Bu, T.W. Noh, J. Lee, W. Jo, Nature (London) 401, 682 (1999)CrossRefGoogle Scholar
  2. 2.
    Y.H. Xu, J.D. Mackenzie, Integrated Ferroelectrics 1, 17 (1992)Google Scholar
  3. 3.
    H.N. Lee, D. Hesse, N. Zakharov, U. Gösele, Science 296, 2006 (2002)CrossRefGoogle Scholar
  4. 4.
    K. Kato, K. Suzuki, K. Nishizawa, T. Miki, Appl. Phys. Lett. 78, 1119 (2001)CrossRefGoogle Scholar
  5. 5.
    K.M. Satyalakshmi, M. Alexe, A. Pignolet, N.D. Zakharov, C. Harnagea, S. Senz, D. Hesse, Appl. Phys. Lett. 74, 603 (1999)CrossRefGoogle Scholar
  6. 6.
    A. Kingon, Nature (London) 401, 658 (1999)CrossRefGoogle Scholar
  7. 7.
    S.B. Majumder, M. Jain, R.S. Katiyar, Thin Solid Films 402, 90 (2002)CrossRefGoogle Scholar
  8. 8.
    Y. Hou, X.H. Xu, H. Wang, M. Wang, S.X. Shang, Appl. Phys. Lett. 78, 1733 (2001)CrossRefGoogle Scholar
  9. 9.
    A.Q. Jiang, Z.X. Hu, L.D. Zhang, Appl. Phys. Lett. 74, 114 (1999)CrossRefGoogle Scholar
  10. 10.
    Y. Shimakawa, Y. Kubo, Y. Tauchi, H. Asano, T. Kamiyama, F. Izumi, Z. Hiroi, Appl. Phys. Lett. 79, 2791 (2001)CrossRefGoogle Scholar
  11. 11.
    M.W. Chu, M. Ganne, M.T. Caldes, L. Brohan, J. Appl. Phys. 91, 3178 (2002)CrossRefGoogle Scholar
  12. 12.
    H.S. Gu, D.H. Bao, S.M. Wang, D.F. Gao, A.X. Kuang, XJ. Li, Thin Solid Films 283, 81 (1996)CrossRefGoogle Scholar
  13. 13.
    M. Yamaguchi, T. Nagamoto, O. Omoto, Thin Solid Films 300, 299 (1997)CrossRefGoogle Scholar
  14. 14.
    X.S. Wang, J.W. Zhai, L.Y. Zhang, X. Yao, Infrared Physics and Technology 40, 55 (1999)CrossRefMATHGoogle Scholar
  15. 15.
    G.S. Wang, X.J. Meng, Z.Q. Lai, J. Yu, J.L. Sun, S.L. Guo, J.H. Chu, Appl. Phys. A 76, 83 (2003)CrossRefGoogle Scholar
  16. 16.
    Z.G. Hu, G.S. Wang, Z.M. Huang, J.H. Chu, J. Appl. Phys. 93, 3811 (2003)CrossRefGoogle Scholar
  17. 17.
    R. Swanepoel, J. Phys. E: Sci. Instrum. 16, 1214 (1983)CrossRefGoogle Scholar
  18. 18.
    J.C. Manifacier, J. Gasiot, J.P. Fillard, J. Phys. E 9, 1002 (1976)CrossRefGoogle Scholar
  19. 19.
    C.H. Peng, S.B. Desu, J. Am. Ceram. Soc. 77, 929 (1994)Google Scholar
  20. 20.
    Z.G. Hu, Z.M. Huang, Z.Q. Lai, G.S. Wang, J.H. Chu, Thin Solid Films 437, 223 (2003)CrossRefGoogle Scholar
  21. 21.
    R. Ferrini, G. Guizzetti, M. Patrini, A. Parisini, L. Tarricone, B. Valenti, Eur. Phys. J. B 27, 449 (2002)CrossRefGoogle Scholar
  22. 22.
    Optical Properties of Thin Solid Films, edited by O.S. Heavens (Dover, New York, 1965)Google Scholar
  23. 23.
    D. Davazoglou, Appl. Phys. Lett. 70, 246 (1997)CrossRefGoogle Scholar
  24. 24.
    D. Davazoglou, Thin Solid Films 302, 204 (1997)CrossRefGoogle Scholar
  25. 25.
    G.E. Jellison Jr, F.A. Modine, Appl. Phys. Lett. 69, 371 (1996); G.E. Jellison Jr, F.A. Modine, Appl. Phys. Lett. 69, 2137 (1996)CrossRefGoogle Scholar
  26. 26.
    Y.J. Cho, N.V. Nguyen, C.A. Richter, J.R. Ehrstein, B.H. Lee, J.C. Lee, Appl. Phys. Lett. 80, 1249 (2002)CrossRefGoogle Scholar
  27. 27.
    G.E. Jellison Jr, Thin Solid Films 234, 416 (1993)CrossRefGoogle Scholar
  28. 28.
    D.E. Aspnes, A.A. Studna, E. Kinsbron, Phys. Rev. B 29, 768 (1984)CrossRefGoogle Scholar
  29. 29.
    Handbook of Optical Constants of Solids, edited by E.D. Palik (Academic Press, New York, 1985)Google Scholar
  30. 30.
    M. DiDomenico Jr, S.H. Wemple, J. Appl. Phys. 40, 720 (1969)CrossRefGoogle Scholar
  31. 31.
    V. Srikant, D.R. Clarke, J. Appl. Phys. 81, 6357 (1997)CrossRefGoogle Scholar
  32. 32.
    B. Aurivillius, Ark. Kemi 1, 499 (1949)Google Scholar
  33. 33.
    Z.G. Hu, G.S. Wang, Z.M. Huang, X.J. Meng, F.W. Shi, J.H. Chu, Jpn J. Appl. Phys. 42, 1400 (2003)CrossRefGoogle Scholar
  34. 34.
    S.Y. Kim, Appl. Opt. 35, 6703 (1996)Google Scholar
  35. 35.
    When this is done, the parameters in Table 1 are changed beyond the indicated errors bars, except for the thicknesses. The largest changes occur for the oscillator strengthsGoogle Scholar

Copyright information

© Springer-Verlag Berlin/Heidelberg 2004

Authors and Affiliations

  • Z. G. Hu
    • 1
  • Z. M. Huang
    • 1
  • Y. N. Wu
    • 1
  • S. H. Hu
    • 1
  • G. S. Wang
    • 1
  • J. H. Ma
    • 1
  • J. H. Chu
    • 1
  1. 1.National Laboratory for Infrared Physics, Shanghai Institute of Technical PhysicsChinese Academy of Sciences200083P.R. China

Personalised recommendations