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Structure and luminescence of silicon irradiated by protons

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Inorganic Materials: Applied Research Aims and scope

Abstract

The temperature dependence of photoluminescence (PL) in the range 8–300 K is studied for single crystalline silicon irradiated by protons at high temperatures. It is shown that the samples with p-type conductivity display intense PL in contrast to the samples with n-type conductivity, which do not display photo-luminescence. Studies using high-resolution transmission electron microscopy (TEM) have shown that photoluminescence exists until crack formation and splitting of the irradiated layer. The rodlike defects {113} formed during irradiation transform into residual fragments of dislocation structures.

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Correspondence to N. N. Gerasimenko.

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Original Russian Text © N.N. Gerasimenko, A.N. Mikhailov, V.V. Kozlovskii, O.A. Zaporozhan, N.A. Medetov, D.I. Smirnov, D.A. Pavlov, A.I. Bobrov, 2013, published in Perspektivnye Materialy, 2013, No. 8, pp. 18–23.

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Gerasimenko, N.N., Mikhailov, A.N., Kozlovskii, V.V. et al. Structure and luminescence of silicon irradiated by protons. Inorg. Mater. Appl. Res. 5, 133–137 (2014). https://doi.org/10.1134/S2075113314020063

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  • DOI: https://doi.org/10.1134/S2075113314020063

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