Abstract
Ni and Ni-B films that contain 4–20 at % boron are produced by electroplating from baths containing sodium decahydroclovodecarborate and borane-morpholine as boron sources. The chemical state of Ni, B, and O atoms on the original film surface, as well as in that etched to 1 μm or annealed in air at 700°C was determined using X-ray photoelectron spectroscopy (XPS). Judging from the absolute values and directions of the peak shifts in XPS spectra of freshly obtained films, it is assumed that Ni and B atoms chemically interact with each other and Ni-Ni bonds are replaced by shorter Ni-B bonds. Boron is segregated in the surface layer of Ni-B films and hampers the thermal oxidation of nickel.
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References
Delaunois, F., Petitjean, J.P., Lienard, P., et al., Surf. Coat. Technol., 2000, vol. 124, p. 201.
Krishnaveni, K., Sankara Narayanan, T.S.N., and Seshadri, S.K, Surf. Coat. Technol., 2005, vol. 190, p. 115.
Lee, K.H., Chang, D., and Kwon, S.C., Electrochim. Acta, 2005, vol. 50, p. 4538.
Gaevskaya, T.V., Novotortseva, I.G., and Tsybulskaya, L.S., Met. Finish., 1996, vol. 94, p. 100.
Oraon, B., Majumdar, G., and Ghosh, B., Mater. Des., 2008, vol. 29, p. 1412.
Dervos, C.T., Novakovic, J., and Vassiliou, P., Mater. Lett., 2004, vol. 58, p. 619.
Baskaran, I. and Sakthi, Kumar, R., Sankara Narayanan, T.S.N., et al., Surf. Coat. Technol., 2006, vol. 200, p. 6888.
Pichard, C.R., Bouhala, Z., Nosser, A.J., et al., J. Mater. Sci., 1985, vol. 20, p. 3305.
Krishnaveni, K., Sankara Narayanan, T.S.N., and Seshadri, S.K, Trans. Indian Inst. Met., 2003, vol. 56, p. 341.
Samsonov, G.V., Markovskii, L.Ya., Zhigach, A.F., et al., Bor, ego soedineniya i splavy, (Boron, Its Compounds and Alloys), Samsonov, G.V., Ed., Kiev: Izd. AN UkrSSR, 1960.
Val’syunene, Ya.I. and Norkus, P.K., Tr. AN Lit.SSR, Ser. B., 1972, vol. 1, no. 68, p. 93.
Bekish, Yu.N., Tsybulskaya, L.S., and Gaevskaya, T.V., Vest. BGU, Ser. 2., 2008, no. 3, p. 9.
Schreifels, J.A., Maybury, P.C., and Swartz, W.E., J. Catal., 1980, vol. 65, no. 1, p. 195.
Klein, J.C. and Hercules, D.M., J. Catal., 1983, vol. 82, no. 2, p. 424.
Li, C.P., Proctor, A., and Hercules, D.M., Appl. Spectrosc., 1984, vol. 38, no. 6, p. 755.
Mandale, A.B., Badrinarayanan, S., Date, S.K., et al., J. Electron Spectrosc. Relat. Phenom, 1984, vol. 33, no. 1, p. 61.
Dickinson, T., Povey, A.F., and Sherwood, P.M.A., J. Chem. Soc., Faraday Trans. 1, 1977, vol. 73, p. 327.
McIntyre, N.S. and Cook, M.G., Anal. Chem., 1975, vol. 47, p. 2208.
Diplas, S., Lehrmann, J., Jorgensen, S., et al., Surf. Interface Anal., 2005, vol. 37, p. 459.
Li, H., Li, H., and Deng, J.-F., Mater. Lett., 2001, vol. 50, p. 41.
Wang, M., Li, H., Wu, Y., et al., Mater. Lett., 2003, vol. 57, p. 2954.
He, Y., Qiao, M., Hu, H., et al., Appl. Catal. Gen., 2002, vol. 228, p. 29.
Li, H., Li, H., Dai, W., et al., Appl. Catal. Gen., 2003, vol. 238, p. 119.
Li, H., Wu, Y., Zhang, J., et al., Appl. Catal. Gen., 2004, vol. 275, p. 199.
Diplas, S., Lehrmann, J., Jorgensen, S., t al., Phil. Mag., 2005, vol. 85, no. 10, p. 981.
Hendrickson, D.N., Hollander, J.M., and Jolly, W.L., Inorg. Chem., 1970, vol. 9, no. 3, p. 612.
Shalvoy, R.B., Reucroft, P.J., and Davis, B.H., J. Catal., 1979, vol. 56, no. 3, p. 336.
Nefodov, V.I., Salyn, Y.V., Leonhardt, G., et al., J. Electron Spectrosc. Relat. Phenom., 1977, vol. 10, no. 2, p. 121.
Haber, J., Stoch, J., and Ungier, L., J. Electron Spectrosc. Relat. Phenom., 1976, vol. 9, no. 5, p. 459.
Nefedov, V.I., Rentgenoelektronnaya spektroskopiya khimicheskikh soedinenii (X-ray Photoelectron Spectroscopy of Chemical Compounds), Moscow: Khimiya, 1984.
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Original Russian Text © Yu.N. Bekish, T.V. Gaevskaya, L.S. Tsybulskaya, Goo-Yul. Lee, Man. Kim, 2010, published in Fizikokhimiya Poverkhnosti i Zashchita Materialov, 2010, Vol. 46, No. 3, pp. 276–282.
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Bekish, Y.N., Gaevskaya, T.V., Tsybulskaya, L.S. et al. Studying Ni-B alloys with X-ray photoelectron spectroscopy. Prot Met Phys Chem Surf 46, 325–331 (2010). https://doi.org/10.1134/S2070205110030068
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DOI: https://doi.org/10.1134/S2070205110030068
Keywords
- Nickel
- Boron
- Boron Atom
- Boron Content
- Boron Oxide