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X-Ray Diffraction Study of Effect of Filler Concentration and Thickness of Poly-p-xylylene–Cadmium Sulphide Nanocomposite Films on Their Structure

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Abstract—

The structure of poly-p-xylylene–cadmium sulfide (PPX–CdS) nanocomposite films of different thickness (~0.2, ~0.5, and ~1 μm) is studied by X-ray diffraction in a wide range of CdS concentrations, as well as the structure of single-component CdS and PPX films of different thickness. The films are obtained by solid-phase cryochemical synthesis on optical quartz and single-crystal silicon substrates. The results of the study show that CdS nanoparticles in PPX-CdS films with a thickness of ~ 0.2 μm with filler content of C ~ 10.5–13.5 vol % and in a CdS film of the same thickness have a crystal structure of a wurtzite type with an average size of coherent scattering regions of ~30 nm in PPX–CdS and ~60 nm in CdS films. For nanocomposite films with a thickness of ~0.2 μm (C ~ 8 vol %), ~0.5 and ~1 μm (C ~ 5–90 vol %), as well as for a CdS film with a thickness of ~1 μm, only diffusive diffraction maxima are observed, on the basis of which the conclusion is drawn that the CdS nanoparticles in these films have an amorphous or defective crystal structure and a size of ~1–3 nm. The PPX matrix in all studied nanocomposite films has a low-ordered (amorphous) structure, as in a single-component film of this polymer with a thickness of ~0.5 μm.

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Funding

Study was supported by the Russian Foundation for Basic Research (grant no. 18-03-00582), in the frame of state assignments for the Institute of Biochemical Physics of the Russian Academy of Sciences (no. 01201253304) and the Institute of Problems of Chemical Physics of the Russian Academy of Sciences (no. АААА-А19-119101590029-0).

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Authors and Affiliations

  1. Emanuel Institute of Biochemical Physics, Russian Academy of Sciences, 119334, Moscow, Russia

    O. P. Ivanova, A. V. Krivandin, E. P. Krinichnaya & T. S. Zhuravleva

  2. Institute of Problems of Chemical Physics, Russian Academy of Sciences, 142432, Chernogolovka, Moscow region, Russia

    A. A. Piryazev

  3. National Research Center Kurchatov Institute, 123182, Moscow, Russia

    S. A. Zav’yalov

Authors
  1. O. P. Ivanova
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  2. A. V. Krivandin
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  3. E. P. Krinichnaya
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  4. A. A. Piryazev
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  5. S. A. Zav’yalov
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  6. T. S. Zhuravleva
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Correspondence to O. P. Ivanova or T. S. Zhuravleva.

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Translated by S. Rostovtseva

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Ivanova, O.P., Krivandin, A.V., Krinichnaya, E.P. et al. X-Ray Diffraction Study of Effect of Filler Concentration and Thickness of Poly-p-xylylene–Cadmium Sulphide Nanocomposite Films on Their Structure. Nanotechnol Russia 15, 753–759 (2020). https://doi.org/10.1134/S1995078020060105

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  • DOI: https://doi.org/10.1134/S1995078020060105

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