Abstract
A study of functioning of the magneto-optical method as part of magnetic force microscopy (MFM) is presented. Major errors in measuring the samples with MFM are discussed. The magneto-optical method enables us to perform a preliminary verification of a sample magnetic structure, providing minimal errors being specific for MFM. Design options for operation of the magneto-optical method as a part of MFM are proposed.
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References
Nanotechnologies in Electronics, Ed. by Yu. A. Chaplygin (Tekhnosfera, Moscow, 2015), No. 3 [in Russian].
V. L. Mironov, Principles of Scanning Probe Microscopy (Tekhnosfera, Moscow, 2004) [in Russian].
Yu. A. Chaplygin and V. I. Shevyakov, “Investigation into the effect of cantilever structural parameters on the sensitivity of magnetic force microscopy,” Nanotechnol. Russ. 8, 186 (2013).
S. Yu. Krasnoborodko, A. B. Shubin, V. I. Shevyakov, et al., Mikroelektronika 40 (7), 93–96 (2011).
S. Yu. Krasnoborodko, S. A. Smagulova, Yu. A. Chaplygin, and V. I. Shevyakov, “Modification of cantilevers for atomic-force microscopy using the method of exposure defocused ion beam,” Proc. SPIE 9440, 94400 (2014).
A. V. Pupii, A. S. Batupin, E. P. Sheshin, and P. V. Sherstnev, “Quantitative calibration of magnetic force microscopy tips by using current-carrying wires,” Nano-Mikrosist. Tekh., No. 84, 70–74 (2007).
V. A. Bykov, A. M. Alekseev, V. N. Ryabokon’, and S. A. Saunin, “Measurement method of parameters of sufrace magnetic field using scanning probe microscope,” RF Patent No. 2193769 (2002).
G. S. Krinchik, Physics of Magnetic Phenomena (Mosk. Gos. Univ., Moscow, 1985) [in Russian].
A. K. Zvezdin and V. A. Kotov, Magnetooptics of Thin Films (Nauka, Moscow, 1988) [in Russian].
R. Azzam and N. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977; Mir, Moscow, 1981).
V. F. Shkar’, V. P. Denisenkov, A. M. Grishin, A. A. Yalali, S. I. Khartsev, E. I. Nikolaev, and V. N. Sayapin, “A manifestation of magnetism of bismuth in iron garnet films,” Phys. Solid State 45, 2334 (2003).
W. Dickson, A. Stashkevitch, J. B. Youssef, S. Takahashi, and A. V. Zayats, “SNOM imaging of thick ferromagnetic films: image formation mechanisms and limitation,” Opt. Commun. 250, 126–136 (2005).
C. Yu. Krasnoborod’ko, V. M. Roshchin, M. V. Silibin, and V. I. Shevyakov, “The capabilities of the pulsed plasma deposition to create a magnetic force microscope cantilevers,” Khim. Fiz. Mezoskop. 13 (3), 444–448 (2011).
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Original Russian Text © Yu.E. Vysokikh, A.V. Shelaev, V.I. Shevyakov, A.R. Prokopov, A.N. Belov, S.Yu. Krasnoborod’ko, 2016, published in Rossiiskie Nanotekhnologii, 2016, Vol. 11, Nos. 11–12.
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Vysokikh, Y.E., Shelaev, A.V., Shevyakov, V.I. et al. Study of functioning of the magneto-optical method as part of magnetic force microscopy. Nanotechnol Russia 11, 815–819 (2016). https://doi.org/10.1134/S1995078016060203
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DOI: https://doi.org/10.1134/S1995078016060203