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Peculiarities in the measurements of magnetic anisotropy in thin films and nanostructures by the magnetooptical Kerr effect

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Abstract

Cobalt polycrystalline thin films, sputtered by a magnetron system, and cobalt nanostructures, patterned by electron-beam lithography, were studied. We propose an improved magnetooptical method for measuring the magnetic anisotropy field in thin films and arrays of nanostructures. We demonstrate that our method is applicable for a precise investigation of the configurational anisotropy of magnetization reversal in nanostructure arrays.

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Authors and Affiliations

  1. Far Eastern Federal University, ul. Sukhanova 8, Vladivostok, 690095, Russia

    M. E. Stebliy, A. V. Ognev, A. S. Samardak & L. A. Chebotkevich

Authors
  1. M. E. Stebliy
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  2. A. V. Ognev
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  3. A. S. Samardak
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  4. L. A. Chebotkevich
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Corresponding author

Correspondence to M. E. Stebliy.

Additional information

Original Russian Text © M.E. Stebliy, A.V. Ognev, A.S. Samardak, L.A. Chebotkevich, 2014, published in Rossiiskie Nanotekhnologii, 2014, Vol. 9, Nos. 7–8.

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Stebliy, M.E., Ognev, A.V., Samardak, A.S. et al. Peculiarities in the measurements of magnetic anisotropy in thin films and nanostructures by the magnetooptical Kerr effect. Nanotechnol Russia 9, 457–460 (2014). https://doi.org/10.1134/S199507801404017X

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  • DOI: https://doi.org/10.1134/S199507801404017X

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