Abstract
We consider an algorithm for monitoring the process of sputter deposition of optical coatings based on the analysis of sample data of broadband measurements for a fixed set of wavelengths. On the one hand, the considered algorithm uses broadband measurement data, which is an advantage compared to using only monochromatic measurement data for one fixed wavelength, and on the other hand, it is fast compared to algorithms that use complete broadband measurement data. It has been demonstrated that the proposed algorithm allows one to obtain fairly accurate estimates of the layer thicknesses in deposited multilayer optical coatings.
REFERENCES
M. Born and E. Wolf, Principles of Optics: Electromagnetic Theory of Propagation, Interference and Diffraction of Light (Cambridge Univ. Press, Cambridge, 2013).
A. Macleod, “Monitoring of optical coatings,” Appl. Optim. 20, 82–89 (1981).
A. Piegari and F. Flory, Optical Thin Films and Coatings (Woodhead, Cambridge, 2018).
T. F. Isaev, I. V. Kochikov, D. V. Lukyanenko, A. V. Tikhonravov, and A. G. Yagola, “Regularizing algorithms for the determination of thickness of deposited layers in optical coating production,” Eurasian J. Math. Comput. Appl. 6 (4), 38–47 (2018).
T. F. Isaev, D. V. Lukyanenko, A. V. Tikhonravov, and A. G. Yagola, “Algorithms for solving inverse problems in the optics of layered media based on comparing the extrema of spectral characteristics,” Zh. Vychisl. Mat. Mat. Fiz. 57 (5), 867–875 (2017) [Comput. Math. Math. Phys. 57 (5), 867–875 (2017)].
I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D. V. Lukyanenko, A. V. Tikhonravov, and A. G. Yagola, “A nonlocal algorithm for analyzing the data of monochromatic optical control in the process of multilayer coating deposition,” Numer. Methods Program. 20 (62), 471–480 (2020).
I. V. Kochikov, Yu. S. Lagutin, A. A. Lagutina, D.V. Lukyanenko, A.V. Tikhonravov, and A. G. Yagola, “Raising the accuracy of monitoring the optical coating deposition by application of a nonlocal algorithm of data analysis,” J. Appl. Ind. Math. 14 (2), 330–339 (2020).
A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Investigation of the effect of accumulation of thickness errors in optical coating production using broadband optical monitoring,” Appl. Optim. 45, 7026–7034 (2006).
A. V. Tikhonravov, M. K. Trubetskov, and T. V. Amotchkina, “Statistical approach to choosing a strategy of monochromatic monitoring of optical coating production,” Appl. Optim. 45, 7863–7870 (2006).
Funding
This work was financially supported by the Russian Science Foundation, project 21-11-00011, https://rscf.ru/en/project/21-11-00011/.
Author information
Authors and Affiliations
Corresponding authors
Additional information
Translated by V. Potapchouck
Rights and permissions
About this article
Cite this article
Shinkarev, V.D., Lukyanenko, D.V., Tikhonravov, A.V. et al. Algorithm for Monitoring Optical Coating Sputter Deposition Based on Broadband Measurement Sample Data. J. Appl. Ind. Math. 17, 608–615 (2023). https://doi.org/10.1134/S1990478923030146
Received:
Revised:
Accepted:
Published:
Issue Date:
DOI: https://doi.org/10.1134/S1990478923030146